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Xia, Qing, Cao, Zong Jie, Wang, Yuan Da, Sun, Peng (2012) Accelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure. Key Engineering Materials, 531. 580-583 doi:10.4028/www.scientific.net/kem.531-532.580

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Reference TypeJournal (article/letter/editorial)
TitleAccelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure
JournalKey Engineering Materials
AuthorsXia, QingAuthor
Cao, Zong JieAuthor
Wang, Yuan DaAuthor
Sun, PengAuthor
Year2012 (December)Volume531
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/kem.531-532.580Search in ResearchGate
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Mindat Ref. ID12014719Long-form Identifiermindat:1:5:12014719:1
GUID0
Full ReferenceXia, Qing, Cao, Zong Jie, Wang, Yuan Da, Sun, Peng (2012) Accelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure. Key Engineering Materials, 531. 580-583 doi:10.4028/www.scientific.net/kem.531-532.580
Plain TextXia, Qing, Cao, Zong Jie, Wang, Yuan Da, Sun, Peng (2012) Accelerated Degradation Modeling and Statistical Analysis of MEMS Device Based on Competing Failure. Key Engineering Materials, 531. 580-583 doi:10.4028/www.scientific.net/kem.531-532.580
In(n.d.) Key Engineering Materials Vol. 531. Trans Tech Publications, Ltd.

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