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CULLEN, G. W., CORBOY, J. F. (1974) ChemInform Abstract: A COMPARISON OF THE SEMICONDUCTING PROPERTIES OF THIN FILMS OF SILICON ON SAPPHIRE AND SPINEL. Chemischer Informationsdienst, 5 (51) doi:10.1002/chin.197451020

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Reference TypeJournal (article/letter/editorial)
TitleChemInform Abstract: A COMPARISON OF THE SEMICONDUCTING PROPERTIES OF THIN FILMS OF SILICON ON SAPPHIRE AND SPINEL
JournalChemischer Informationsdienst
AuthorsCULLEN, G. W.Author
CORBOY, J. F.Author
Year1974 (December 24)Volume5
Issue51
PublisherWiley
DOIdoi:10.1002/chin.197451020Search in ResearchGate
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Mindat Ref. ID14702904Long-form Identifiermindat:1:5:14702904:3
GUID0
Full ReferenceCULLEN, G. W., CORBOY, J. F. (1974) ChemInform Abstract: A COMPARISON OF THE SEMICONDUCTING PROPERTIES OF THIN FILMS OF SILICON ON SAPPHIRE AND SPINEL. Chemischer Informationsdienst, 5 (51) doi:10.1002/chin.197451020
Plain TextCULLEN, G. W., CORBOY, J. F. (1974) ChemInform Abstract: A COMPARISON OF THE SEMICONDUCTING PROPERTIES OF THIN FILMS OF SILICON ON SAPPHIRE AND SPINEL. Chemischer Informationsdienst, 5 (51) doi:10.1002/chin.197451020
In(1974, December) Chemischer Informationsdienst Vol. 5 (51) Wiley

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Cullen, G. W., Corboy, J. F. (1974) A Comparison of the Semiconducting Properties of Thin Films of Silicon on Sapphire and Spinel. Journal of the Electrochemical Society, 121. 1345pp. doi:10.1149/1.2401684
JASTRZEBSKI, L., SMELTZER, R. K., CULLEN, G. W., LAGOWSKI, J. (1984) ChemInform Abstract: EFFECT OF HEAT-TREATMENT ON ELECTRICAL PROPERTIES OF ION-IMPLANTED SILICON ON SAPPHIRE. Chemischer Informationsdienst, 15 (38) doi:10.1002/chin.198438012
HINZE, J. W., BAKER, J. A., PATTERSON, J. W. (1974) ChemInform Abstract: INTERFACE STABILITY IN THE ELECTROLYTIC DECOMPOSITION OF SILICON DIOXIDE FILMS AT ELEVATED TEMPERATURES. Chemischer Informationsdienst, 5 (51) doi:10.1002/chin.197451019
ANDERSON, R. M. (1974) ChemInform Abstract: MICROSTRUCTURAL ANALYSIS OF EVAPORATED AND PYROLYTIC SILICON THIN FILMS. Chemischer Informationsdienst, 5 (5) doi:10.1002/chin.197405004
JASTRZEBSKI, L., CORBOY, J. F., PAGLIARO, R. JUN., SOYDAN, R. (1986) ChemInform Abstract: Preparation of Thin (0.6 um) Continuous Monocrystalline Silicon over SiO2. Chemischer Informationsdienst, 17 (16) doi:10.1002/chin.198616034
REVESZ, A. G., REYNOLDS, J. H., ALLISON, J. F. (1976) ChemInform Abstract: OPTICAL PROPERTIES OF TANTALUM OXIDE FILMS ON SILICON. Chemischer Informationsdienst, 7 (39) doi:10.1002/chin.197639002
BANDYOPADHYAY, G., FULRATH, R. M. (1974) ChemInform Abstract: PROCESSING PARAMETERS AND PROPERTIES OF LITHIUM FERRITE SPINEL. Chemischer Informationsdienst, 5 (29) doi:10.1002/chin.197429015
COHEN, MORRIS (1974) ChemInform Abstract: THIN OXIDE FILMS ON IRON. Chemischer Informationsdienst, 5 (39) doi:10.1002/chin.197439068
MANASEVIT, H. M., ERDMANN, F. M., THORSEN, A. C. (1976) ChemInform Abstract: PREPARATION AND PROPERTIES OF (111) SILICON FILMS GROWN ON SAPPHIRE BY THE SILANE-HYDROGEN PROCESS. Chemischer Informationsdienst, 7 (16) doi:10.1002/chin.197616001
KAMINS, T. I. (1974) ChemInform Abstract: DIFFUSION IN THIN SILICON FILMS FORMED BY ELECTROCHEMICAL ETCHING. Chemischer Informationsdienst, 5 (21) doi:10.1002/chin.197421009
YIM, W. M., STOFKO, E. J. (1974) ChemInform Abstract: VAPOR-PHASE EPITAXIAL GROWTH OF CDSE ON SAPPHIRE AND CDS. Chemischer Informationsdienst, 5 (40) doi:10.1002/chin.197440014
 
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