Reference Type | Journal (article/letter/editorial) |
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Title | Dislocation Reduction in GaAs on Si by Thermal Cycles and InGaAs/GaAs Strained-Layer Superlattices |
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Journal | Japanese Journal of Applied Physics |
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Authors | Okamoto, Hiroshi | Author |
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Watanabe, Yoshio | Author |
Kadota, Yoshiaki | Author |
Ohmachi, Yoshiro | Author |
Year | 1987 (December 20) | Volume | 26 |
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Publisher | Japan Society of Applied Physics |
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DOI | doi:10.1143/jjap.26.l1950Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14990123 | Long-form Identifier | mindat:1:5:14990123:1 |
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GUID | 0 |
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Full Reference | Okamoto, Hiroshi, Watanabe, Yoshio, Kadota, Yoshiaki, Ohmachi, Yoshiro (1987) Dislocation Reduction in GaAs on Si by Thermal Cycles and InGaAs/GaAs Strained-Layer Superlattices. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l1950 |
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Plain Text | Okamoto, Hiroshi, Watanabe, Yoshio, Kadota, Yoshiaki, Ohmachi, Yoshiro (1987) Dislocation Reduction in GaAs on Si by Thermal Cycles and InGaAs/GaAs Strained-Layer Superlattices. Japanese Journal of Applied Physics, 26. doi:10.1143/jjap.26.l1950 |
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In | (1987) Japanese Journal of Applied Physics Vol. 26. Japan Society of Applied Physics |
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