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Fitzgerald, A. G., McHardy, C. P. (1984) Crystallization of amorphous germanium selenide films in the transmission electron microscope. Journal of Materials Science Letters, 3 (1) 91-92 doi:10.1007/bf00720085

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Reference TypeJournal (article/letter/editorial)
TitleCrystallization of amorphous germanium selenide films in the transmission electron microscope
JournalJournal of Materials Science Letters
AuthorsFitzgerald, A. G.Author
McHardy, C. P.Author
Year1984 (January)Volume3
Issue1
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00720085Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16408720Long-form Identifiermindat:1:5:16408720:0
GUID0
Full ReferenceFitzgerald, A. G., McHardy, C. P. (1984) Crystallization of amorphous germanium selenide films in the transmission electron microscope. Journal of Materials Science Letters, 3 (1) 91-92 doi:10.1007/bf00720085
Plain TextFitzgerald, A. G., McHardy, C. P. (1984) Crystallization of amorphous germanium selenide films in the transmission electron microscope. Journal of Materials Science Letters, 3 (1) 91-92 doi:10.1007/bf00720085
In(1984, January) Journal of Materials Science Letters Vol. 3 (1) Springer Science and Business Media LLC

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Fitzgerald, A. G. (1982) Electron beam crystallization of amorphous germanium films in the electron microscope. Journal of Materials Science Letters, 1 (4) 145-146 doi:10.1007/bf00730943
Fitzgerald, A. G., Flynn, M., McHardy, C. P. (1987) Behaviour of amorphous GeTe and As2Te3 films under electron irradiation. Journal of Materials Science Letters, 6 (4) 391-393 doi:10.1007/bf01756773
Romero, J.S, Fitzgerald, A.G, Rose, M.J (2004) A transmission electron microscope study of metal/chalcogenide amorphous thin films. Applied Surface Science, 234. 369-373 doi:10.1016/j.apsusc.2004.05.039
Fitzgerald, A. G., McHardy, C. P. (1986) The diffusion of copper and silver in amorphous chalcogenide thin films. Surface and Interface Analysis, 9 (5). 334 doi:10.1002/sia.740090518
Tjong, S. C. (1984) Transmission electron microscopy study of the passive films on nickel. Journal of Materials Science Letters, 3 (10) 845-846 doi:10.1007/bf00719567
Pande, C. S., Smith, S., Vardiman, R. G. (1984) Specimen preparation techniques for transmission electron microscope study of multifilamentary V3Ga superconducting wires. Journal of Materials Science Letters, 3 (6) 495-498 doi:10.1007/bf00720981
Donovan, P., George, B., Bruson, A., Dufour, C., Marchal, G., Mangin, Ph. (1991) Interpretation of transmission electron microscope images of amorphous silicon/germanium and silicon/iron multilayers. Journal of Applied Physics, 69 (3). 1371-1376 doi:10.1063/1.347275
Lorimer, G W (1984) X-ray microanalysis in the transmission electron microscope. Bulletin of Materials Science, 6. 503-512 doi:10.1007/bf02744080
Hjartarson, G. A., Kao, K. C. (1984) Photoresponse of amorphous Se1?x Te x films. Journal of Materials Science Letters, 3 (3) 253-256 doi:10.1007/bf00726808
Fitzgerald, A.G., McHardy, C.P. (1985) Electron spectroscopy and diffraction studies of metal contact reactions in amorphous chalcogenides. Surface Science Letters, 162 (1). doi:10.1016/0167-2584(85)90307-x
Tanaka, Nobuo, Kawahara, Michiharu (2001) Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films. Materials Science and Engineering: A, 312. 25-30 doi:10.1016/s0921-5093(00)01900-6
 
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