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Tjong, S. C. (1984) Transmission electron microscopy study of the passive films on nickel. Journal of Materials Science Letters, 3 (10) 845-846 doi:10.1007/bf00719567

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Reference TypeJournal (article/letter/editorial)
TitleTransmission electron microscopy study of the passive films on nickel
JournalJournal of Materials Science Letters
AuthorsTjong, S. C.Author
Year1984 (October)Volume3
Issue10
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00719567Search in ResearchGate
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Mindat Ref. ID16408724Long-form Identifiermindat:1:5:16408724:8
GUID0
Full ReferenceTjong, S. C. (1984) Transmission electron microscopy study of the passive films on nickel. Journal of Materials Science Letters, 3 (10) 845-846 doi:10.1007/bf00719567
Plain TextTjong, S. C. (1984) Transmission electron microscopy study of the passive films on nickel. Journal of Materials Science Letters, 3 (10) 845-846 doi:10.1007/bf00719567
In(1984, October) Journal of Materials Science Letters Vol. 3 (10) Springer Science and Business Media LLC

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Tjong, S. C. (1985) TEM study of the passive film on iron-chromium alloys. Journal of Materials Science Letters, 4 (1) 6-8 doi:10.1007/bf00719881
Martinez-Salazar, J., Cannon, C. G. (1984) Transmission electron microscopy of polyamides. Journal of Materials Science Letters, 3 (8) 693-694 doi:10.1007/bf00719925
Moriya, M., Ives, M. B. (1984) The application of scanning transmission electron microscopy (STEM) to the study of thin anodic films on nickel and nickel-molybdenum alloys. Journal of Microscopy, 133 (2). 155-170 doi:10.1111/j.1365-2818.1984.tb00481.x
Fitzgerald, A. G., McHardy, C. P. (1984) Crystallization of amorphous germanium selenide films in the transmission electron microscope. Journal of Materials Science Letters, 3 (1) 91-92 doi:10.1007/bf00720085
Thornton, M. C., Furneaux, R. C. (1991) Transmission electron microscopy and digital X-ray mapping of ion-beam-thinned porous anodic films formed on aluminium. Journal of Materials Science Letters, 10 (11) 622-624 doi:10.1007/bf00723357
Pande, C. S., Smith, S., Vardiman, R. G. (1984) Specimen preparation techniques for transmission electron microscope study of multifilamentary V3Ga superconducting wires. Journal of Materials Science Letters, 3 (6) 495-498 doi:10.1007/bf00720981
Ji, Huaxia, Marquis, P. M. (1991) Modification of hydroxyapatite during transmission electron microscopy. Journal of Materials Science Letters, 10 (3) 132-134 doi:10.1007/bf02352825
Cao, G. H., Simon, P., Krämer, U., Wimbush, S. C., Holzapfel, B. (2004) Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO. Chemistry of Materials, 16. 842-845 doi:10.1021/cm031044k
Mitchell, D. R. G., Donnelly, S. E. (1991) A transmission electron microscopy study of the effect of the ? ? ? phase transformation of tin on xenon bubbles formed by ion implantation. Journal of Materials Science Letters, 10 (15) 905-907 doi:10.1007/bf00724777
Ahearn, J. S., Laird, C. (1977) Transmission electron microscopy observations of misfit dislocations in GaAsP epitaxial films. Journal of Materials Science, 12. 699-707 doi:10.1007/bf00548160
Chatfield, Ch., Haubner, R., Lux, B. (1989) Examination of thin films of low pressure diamond by transmission electron microscopy. Journal of Materials Science Letters, 8 (10) 1188-1192 doi:10.1007/bf01730066
 
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