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Fitzgerald, A. G., McHardy, C. P. (1986) The diffusion of copper and silver in amorphous chalcogenide thin films. Surface and Interface Analysis, 9 (5). 334 doi:10.1002/sia.740090518

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Reference TypeJournal (article/letter/editorial)
TitleThe diffusion of copper and silver in amorphous chalcogenide thin films
JournalSurface and Interface Analysis
AuthorsFitzgerald, A. G.Author
McHardy, C. P.Author
Year1986 (July)Volume9
Issue5
PublisherWiley
DOIdoi:10.1002/sia.740090518Search in ResearchGate
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Mindat Ref. ID6501064Long-form Identifiermindat:1:5:6501064:8
GUID0
Full ReferenceFitzgerald, A. G., McHardy, C. P. (1986) The diffusion of copper and silver in amorphous chalcogenide thin films. Surface and Interface Analysis, 9 (5). 334 doi:10.1002/sia.740090518
Plain TextFitzgerald, A. G., McHardy, C. P. (1986) The diffusion of copper and silver in amorphous chalcogenide thin films. Surface and Interface Analysis, 9 (5). 334 doi:10.1002/sia.740090518
In(1986, July) Surface and Interface Analysis Vol. 9 (5) Wiley

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Fitzgerald, A. G., Muir, G. (1986) An electron spectroscopy study of sputtered nickel ferrite films. Surface and Interface Analysis, 9 (5). 333 doi:10.1002/sia.740090517
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Petkov, P., Stoilova, A., Nedeva, Y., Petkov, E. (2010) Optical behaviors of thin indium-containing chalcogenide films. Surface and Interface Analysis, 42 (6). 1235-1238 doi:10.1002/sia.3363
Fitzgerald, A. G., Gillies, A. D., Watton, H. L. L. (1990) A comparison of the composition of thin films on substrates determined by EDX and surface analysis. Surface and Interface Analysis, 16 (1). 163-167 doi:10.1002/sia.740160132
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(1986) Masthead. Surface and Interface Analysis, 9 (5). doi:10.1002/sia.740090501
Fitzgerald, A. G., Henderson, A. E., Hicks, S. E., Moir, P. A., Storey, B. E. (1989) Quantification of amorphous SiC: H films using XPS and AES with three standards. Surface and Interface Analysis, 14 (6). 376-380 doi:10.1002/sia.740140614
Abdul-Lettif, Ahmed M. (2003) Grain boundary diffusion coefficients in gold-nickel thin films. Surface and Interface Analysis, 35 (5). 429-431 doi:10.1002/sia.1550
Demanet, C. M. (1986) Diffusion of Cr dopant from substrate GaAs into LPE grown epilayers. Surface and Interface Analysis, 9 (5). 341 doi:10.1002/sia.740090528
 
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