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Fitzgerald, A. G., Gillies, A. D., Watton, H. L. L. (1990) A comparison of the composition of thin films on substrates determined by EDX and surface analysis. Surface and Interface Analysis, 16 (1). 163-167 doi:10.1002/sia.740160132

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Reference TypeJournal (article/letter/editorial)
TitleA comparison of the composition of thin films on substrates determined by EDX and surface analysis
JournalSurface and Interface Analysis
AuthorsFitzgerald, A. G.Author
Gillies, A. D.Author
Watton, H. L. L.Author
Year1990 (July)Volume16
Issue1
PublisherWiley
DOIdoi:10.1002/sia.740160132Search in ResearchGate
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Mindat Ref. ID6502806Long-form Identifiermindat:1:5:6502806:3
GUID0
Full ReferenceFitzgerald, A. G., Gillies, A. D., Watton, H. L. L. (1990) A comparison of the composition of thin films on substrates determined by EDX and surface analysis. Surface and Interface Analysis, 16 (1). 163-167 doi:10.1002/sia.740160132
Plain TextFitzgerald, A. G., Gillies, A. D., Watton, H. L. L. (1990) A comparison of the composition of thin films on substrates determined by EDX and surface analysis. Surface and Interface Analysis, 16 (1). 163-167 doi:10.1002/sia.740160132
In(1990, July) Surface and Interface Analysis Vol. 16 (1) Wiley

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Watton, H. L. L., Fitzgerald, A. G., Moir, P. A. (1991) Composition of thin surface layers obtained by X-ray photoelectron spectroscopy. Surface and Interface Analysis, 17 (6). 320-324 doi:10.1002/sia.740170605
Fitzgerald, A. G., Watton, H. L. L., Storey, B. E., Colligon, J. S., Kheyrandish, H. (1994) Computer programs for surface analysis by SIMS and SNMS. Surface and Interface Analysis, 22 (1). 69-74 doi:10.1002/sia.740220118
Fitzgerald, A. G., Henderson, A. E., Storey, B. E. (1990) A microbeam analytical study of a-C: H films. Surface and Interface Analysis, 16 (1). 497-503 doi:10.1002/sia.7401601104
Guimon, C., Gonbeau, D., Pfister-Guillouzo, G., Dugne, O., Guette, A., Naslain, R., Lahaye, M. (1990) XPS study of BN thin films deposited by CVD on SiC plane substrates. Surface and Interface Analysis, 16 (1). 440-445 doi:10.1002/sia.740160191
Thorne, N. A., Jugnet, Y., Reboul, M., Dunlop, H. (1990) Comparison of the natural oxide films formed on Mg and its alloys. Surface and Interface Analysis, 16 (1). 315 doi:10.1002/sia.740160165
Niemi, E., Stolt, L. (1990) Characterization of CuInSe2 thin films by XPS. Surface and Interface Analysis, 15 (7). 422-426 doi:10.1002/sia.740150705
Fitzgerald, A. G., McHardy, C. P. (1986) The diffusion of copper and silver in amorphous chalcogenide thin films. Surface and Interface Analysis, 9 (5). 334 doi:10.1002/sia.740090518
Janda, M., Stefan, O., Kubový, A., Šťulík, D. (1980) The composition of Cu/Al thin films deposited by isothermal evaporation. Surface and Interface Analysis, 2 (1). 1-4 doi:10.1002/sia.740020102
Phuku, P., Bertrand, P., De Puydt, Y. (1990) Relation between adhesion, microstructure and composition of thermally evaporated Al thin films on PET. Surface and Interface Analysis, 16 (1). 248-249 doi:10.1002/sia.740160154
Benoist, L., Gonbeau, D., Pfister-Guillouzo, G., Schmidt, E., Meunier, G., Levasseur, A. (1994) XPS analysis of lithium intercalation in thin films of molybdenum oxysulphides. Surface and Interface Analysis, 22 (1). 206-210 doi:10.1002/sia.740220146
Molnár, G., Petö, G., Kótai, E., Zsoldos, E., Gyulai, J., Guczi, L. (1992) Oxidation of Gd thin films on Si substrates via grain boundaries. Surface and Interface Analysis, 19 (1). 469-472 doi:10.1002/sia.740190188
 
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