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Babuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1985) Breakdown in titanium oxide thin film capacitors. Journal of Materials Science Letters, 4 (3) 313-314 doi:10.1007/bf00719800

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Reference TypeJournal (article/letter/editorial)
TitleBreakdown in titanium oxide thin film capacitors
JournalJournal of Materials Science Letters
AuthorsBabuji, BellanAuthor
Balasubramanian, C.Author
Radhakrishnan, M.Author
Year1985 (March)Volume4
Issue3
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00719800Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16409224Long-form Identifiermindat:1:5:16409224:2
GUID0
Full ReferenceBabuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1985) Breakdown in titanium oxide thin film capacitors. Journal of Materials Science Letters, 4 (3) 313-314 doi:10.1007/bf00719800
Plain TextBabuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1985) Breakdown in titanium oxide thin film capacitors. Journal of Materials Science Letters, 4 (3) 313-314 doi:10.1007/bf00719800
In(1985, March) Journal of Materials Science Letters Vol. 4 (3) Springer Science and Business Media LLC

See Also

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Babuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1983) Electrical conduction in amorphous titanium nitride films. Journal of Materials Science Letters, 2 (11) 694-696 doi:10.1007/bf00720405
Babuji, Bellan, Radhakrishna, S. (1985) Optical properties of titanium oxide thin films. Journal of Materials Science Letters, 4 (6) 767-769 doi:10.1007/bf00726985
Babuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1983) Dielectric properties of ion plated titanium oxide thin films. Journal of Non-Crystalline Solids, 55 (3) 405-412 doi:10.1016/0022-3093(83)90045-5
Babuji, B., Balasubramanian, C., Radhakrishnan, N., Kasilingam, A. R. (1980) DC conduction studies in ion plated titanium oxide thin films. physica status solidi (a), 60 (1). doi:10.1002/pssa.2210600150
Veluswamy, V. S., Balasubramanian, C., Radhakrishnan, M. (1985) Electrical conduction in ion plated stearic acid thin films. Journal of Materials Science Letters, 4 (4) 439-441 doi:10.1007/bf00719739
Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1982) Dielectric studies on tellurium oxide thin films. Journal of Materials Science, 17. 1623-1626 doi:10.1007/bf00540787
Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1986) Evaporation characteristics of TeO2 in the formation of tellurium oxide thin films. Journal of Materials Science, 21. 246-250 doi:10.1007/bf01144728
Chandra Shekar, M., Hari Babu, V. (1984) Electrical breakdown studies with a.c. voltage on Al-CeO2-Al thin film capacitors. Journal of Materials Science Letters, 3 (9) 795-798 doi:10.1007/bf00727976
Veluswamy, V. S., Balasubramanian, C., Radhakrishnan, M. (1984) Structural and optical studies on ion-plated pyrene thin films. Journal of Materials Science Letters, 3 (11) 1025-1027 doi:10.1007/bf00720347
Mangalaraj, D., Radhakrishnan, M., Balasubramanian, C. (1982) Electrical conduction and breakdown properties of silicon nitride films. Journal of Materials Science, 17. 1474-1478 doi:10.1007/bf00752262
Paramasivam, K. R., Radhakrishnan, M., Balasubramanian, C. (1981) Electrical conduction in evaporated terbium fluoride thin films. Journal of Materials Science, 16. 1183-1186 doi:10.1007/bf01033829
 
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