Reference Type | Journal (article/letter/editorial) |
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Title | Evaporation characteristics of TeO2 in the formation of tellurium oxide thin films |
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Journal | Journal of Materials Science |
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Authors | Lakshminarayan, N. | Author |
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Radhakrishnan, M. | Author |
Balasubramanian, C. | Author |
Year | 1986 (January) | Volume | 21 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf01144728Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9987130 | Long-form Identifier | mindat:1:5:9987130:9 |
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GUID | 0 |
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Full Reference | Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1986) Evaporation characteristics of TeO2 in the formation of tellurium oxide thin films. Journal of Materials Science, 21. 246-250 doi:10.1007/bf01144728 |
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Plain Text | Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1986) Evaporation characteristics of TeO2 in the formation of tellurium oxide thin films. Journal of Materials Science, 21. 246-250 doi:10.1007/bf01144728 |
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In | (n.d.) Journal of Materials Science Vol. 21. Springer Science and Business Media LLC |
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