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Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1982) Dielectric studies on tellurium oxide thin films. Journal of Materials Science, 17. 1623-1626 doi:10.1007/bf00540787

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Reference TypeJournal (article/letter/editorial)
TitleDielectric studies on tellurium oxide thin films
JournalJournal of Materials Science
AuthorsLakshminarayan, N.Author
Radhakrishnan, M.Author
Balasubramanian, C.Author
Year1982 (June)Volume17
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00540787Search in ResearchGate
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Mindat Ref. ID9985536Long-form Identifiermindat:1:5:9985536:5
GUID0
Full ReferenceLakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1982) Dielectric studies on tellurium oxide thin films. Journal of Materials Science, 17. 1623-1626 doi:10.1007/bf00540787
Plain TextLakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1982) Dielectric studies on tellurium oxide thin films. Journal of Materials Science, 17. 1623-1626 doi:10.1007/bf00540787
In(n.d.) Journal of Materials Science Vol. 17. Springer Science and Business Media LLC

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Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1986) Evaporation characteristics of TeO2 in the formation of tellurium oxide thin films. Journal of Materials Science, 21. 246-250 doi:10.1007/bf01144728
Lakshminarayan, N., Radhakrishnan, M., Balasubramanian, C. (1984) Formation, structural and optical properties of tellurium oxide films deposited by a plasma process (PARBAD). Journal of Materials Science, 19. 2368-2372 doi:10.1007/bf01058113
Mangalaraj, D., Radhakrishnan, M., Balasubramanian, C. (1982) Electrical conduction and breakdown properties of silicon nitride films. Journal of Materials Science, 17. 1474-1478 doi:10.1007/bf00752262
Veluswamy, V. S., Balasubramanian, C., Radhakrishnan, M. (1984) Structural and optical studies on ion-plated pyrene thin films. Journal of Materials Science Letters, 3 (11) 1025-1027 doi:10.1007/bf00720347
Ramanujam, R., Radhakrishnan, M., Balasubramanian, C. (1984) Electrical conduction of erbium fluoride thin films. Journal of Materials Science, 19. 2401-2404 doi:10.1007/bf01058118
Ramaraju, A. R., Balasubramanian, C., Radhakrishnan, M. (1981) Optical properties of palmitic acid thin films. Journal of Materials Science, 16. 1431-1434 doi:10.1007/bf01033868
Babuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1985) Breakdown in titanium oxide thin film capacitors. Journal of Materials Science Letters, 4 (3) 313-314 doi:10.1007/bf00719800
Paramasivam, K. R., Radhakrishnan, M., Balasubramanian, C. (1981) Electrical conduction in evaporated terbium fluoride thin films. Journal of Materials Science, 16. 1183-1186 doi:10.1007/bf01033829
Babuji, Bellan, Balasubramanian, C., Radhakrishnan, M. (1983) Dielectric properties of ion plated titanium oxide thin films. Journal of Non-Crystalline Solids, 55 (3) 405-412 doi:10.1016/0022-3093(83)90045-5
Kannan, M. D., Narayandass, Sa. K., Balasubramanian, C., Mangalaraj, D. (1992) D.c. conduction studies on thermally evaporated neodymium oxide thin films. Journal of Materials Science, 27. 5040-5044 doi:10.1007/bf01105271
Babuji, B., Balasubramanian, C., Radhakrishnan, N., Kasilingam, A. R. (1980) DC conduction studies in ion plated titanium oxide thin films. physica status solidi (a), 60 (1). doi:10.1002/pssa.2210600150
 
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