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Messaadi, S., Pichard, C. R., Tosser, A. J. (1986) Effects of ageing procedure on the specular reflection coefficient of thin polycrystalline metal films. Journal of Materials Science Letters, 5 (10) 1036-1038 doi:10.1007/bf01730275

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Reference TypeJournal (article/letter/editorial)
TitleEffects of ageing procedure on the specular reflection coefficient of thin polycrystalline metal films
JournalJournal of Materials Science Letters
AuthorsMessaadi, S.Author
Pichard, C. R.Author
Tosser, A. J.Author
Year1986 (October)Volume5
Issue10
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf01730275Search in ResearchGate
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Mindat Ref. ID16409544Long-form Identifiermindat:1:5:16409544:1
GUID0
Full ReferenceMessaadi, S., Pichard, C. R., Tosser, A. J. (1986) Effects of ageing procedure on the specular reflection coefficient of thin polycrystalline metal films. Journal of Materials Science Letters, 5 (10) 1036-1038 doi:10.1007/bf01730275
Plain TextMessaadi, S., Pichard, C. R., Tosser, A. J. (1986) Effects of ageing procedure on the specular reflection coefficient of thin polycrystalline metal films. Journal of Materials Science Letters, 5 (10) 1036-1038 doi:10.1007/bf01730275
In(1986, October) Journal of Materials Science Letters Vol. 5 (10) Springer Science and Business Media LLC

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Messaadi, S., Pichard, C., Tosser, A. J. (1986) Reinterpretation of thickness-dependent conductivity of thin platinum films. Journal of Materials Science Letters, 5 (9) 873-875 doi:10.1007/bf01729256
Tosser, A. J., Messaadi, S., Pichard, C. R., Humbert, E. (1986) Simple analytical expression for the size effect in thin metal wires. Journal of Materials Science Letters, 5 (11) 1175-1177 doi:10.1007/bf01742238
Tijani, H., Pichard, C. R., Tosser, A. J., Messaadi, S. (1987) Simple analysis of the Iongitudinal magnetoresistance of thin metal wires. Journal of Materials Science Letters, 6 (5) 552-554 doi:10.1007/bf01739281
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
Bedda, M., Messaadi, S., Pichard, C. R., Tosser, A. J. (1986) Analytical expression for the total electrical conductivity of unannealed and annealed metal films. Journal of Materials Science, 21. 2643-2647 doi:10.1007/bf00551466
Tosser, A. J., Pichard, C. R., Lahrichi, M., Bedda, M. (1985) Simple calculation of the Hall coefficient of thin metal films. Journal of Materials Science Letters, 4 (5) 585-588 doi:10.1007/bf00720039
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Pichard, C. R., Messaadi, S., Tosser, A. J., Tellier, C. R. (1988) Analysis of the electrical resistivity of double-layer metal film. Journal of Materials Science, 23. 189-193 doi:10.1007/bf01174052
Pichard, C. R., Vatamanyuk, V. I., Khalid-Naciri, A., Tellier, C. R., Tosser, A. J. (1984) The theoretical values for the resistivity, the tcr and the Hall coefficient of thin columnar and polycrystalline films. Journal of Materials Science Letters, 3 (5) 447-450 doi:10.1007/bf00724389
 
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