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Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391

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Reference TypeJournal (article/letter/editorial)
TitleThree-dimensional strain coefficients of resistivity of thin polycrystalline metal films
JournalJournal of Materials Science
AuthorsTellier, C. R.Author
Pichard, C. R.Author
Tosser, A. J.Author
Year1981 (August)Volume16
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00542391Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9985169Long-form Identifiermindat:1:5:9985169:7
GUID0
Full ReferenceTellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Plain TextTellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
In(n.d.) Journal of Materials Science Vol. 16. Springer Science and Business Media LLC

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Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Three-dimensional analytical expressions of strain gauge coefficients of infinitely thick polycrystalline metal films. Journal of Materials Science, 15. 2991-2994 doi:10.1007/bf00550366
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1981) Theoretical analysis of the Hall effect in thin polycrystalline metallic films. Journal of Materials Science, 16. 451-456 doi:10.1007/bf00738636
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Tosser, A. J., Tellier, C. R., Pichard, C. R. (1981) Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering. Journal of Materials Science, 16. 944-948 doi:10.1007/bf00542738
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Linear variations in conductivity with thickness of thin polycrystalline films. Journal of Materials Science, 15. 2236-2240 doi:10.1007/bf00552312
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1981) Thickness dependence of the temperature coefficient of resistivity of polycrystalline films in a three-dimensional conduction model. physica status solidi (a), 65 (1). 327-334 doi:10.1002/pssa.2210650138
Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Pichard, C. R., Tosser, A. J., Tellier, C. R., Barua, K. C. (1981) Theoretical analysis of the transverse Hall effect in thin monocrystalline films. Journal of Materials Science, 16. 2480-2484 doi:10.1007/bf01113584
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
 
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