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Tosser, A. J., Tellier, C. R., Pichard, C. R. (1981) Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering. Journal of Materials Science, 16. 944-948 doi:10.1007/bf00542738

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Reference TypeJournal (article/letter/editorial)
TitleThin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering
JournalJournal of Materials Science
AuthorsTosser, A. J.Author
Tellier, C. R.Author
Pichard, C. R.Author
Year1981 (April)Volume16
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00542738Search in ResearchGate
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Mindat Ref. ID9984966Long-form Identifiermindat:1:5:9984966:5
GUID0
Full ReferenceTosser, A. J., Tellier, C. R., Pichard, C. R. (1981) Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering. Journal of Materials Science, 16. 944-948 doi:10.1007/bf00542738
Plain TextTosser, A. J., Tellier, C. R., Pichard, C. R. (1981) Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering. Journal of Materials Science, 16. 944-948 doi:10.1007/bf00542738
In(n.d.) Journal of Materials Science Vol. 16. Springer Science and Business Media LLC

See Also

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Pichard, C. R., Tosser, A. J., Tellier, C. R. (1981) Theoretical analysis of the Hall effect in thin polycrystalline metallic films. Journal of Materials Science, 16. 451-456 doi:10.1007/bf00738636
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Linear variations in conductivity with thickness of thin polycrystalline films. Journal of Materials Science, 15. 2236-2240 doi:10.1007/bf00552312
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Pichard, C. R., Tosser, A. J., Tellier, C. R., Barua, K. C. (1981) Theoretical analysis of the transverse Hall effect in thin monocrystalline films. Journal of Materials Science, 16. 2480-2484 doi:10.1007/bf01113584
Pichard, C R, Tellier, C R, Tosser, A J (1979) Decomposition of polycrystalline metallic film resistivity from Mathiessen's rule. Journal of Physics D: Applied Physics, 12. doi:10.1088/0022-3727/12/9/001
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Tellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865
Pichard, C. R., Messaadi, S., Tosser, A. J., Tellier, C. R. (1988) Analysis of the electrical resistivity of double-layer metal film. Journal of Materials Science, 23. 189-193 doi:10.1007/bf01174052
 
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