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Tellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865

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Reference TypeJournal (article/letter/editorial)
TitleElectrical conductivity of thin metal films grown in a columnar fashion
JournalJournal of Materials Science Letters
AuthorsTellier, C. R.Author
Pichard, C. R.Author
Vatamanyuk, V. I.Author
Tosser, A. J.Author
Year1983 (October)Volume2
Issue10
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00719865Search in ResearchGate
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Mindat Ref. ID16408478Long-form Identifiermindat:1:5:16408478:0
GUID0
Full ReferenceTellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865
Plain TextTellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865
In(1983, October) Journal of Materials Science Letters Vol. 2 (10) Springer Science and Business Media LLC

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Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
Pichard, C. R., Vatamanyuk, V. I., Khalid-Naciri, A., Tellier, C. R., Tosser, A. J. (1984) The theoretical values for the resistivity, the tcr and the Hall coefficient of thin columnar and polycrystalline films. Journal of Materials Science Letters, 3 (5) 447-450 doi:10.1007/bf00724389
Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Pichard, C. R., Bedda, M., Vatamanyuk, V. I., Tosser, A. J., Tellier, C. R. (1985) Alternative analytical forms of the Fuchs-Sondheimer function. Journal of Materials Science, 20. 4185-4201 doi:10.1007/bf00552414
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Linear variations in conductivity with thickness of thin polycrystalline films. Journal of Materials Science, 15. 2236-2240 doi:10.1007/bf00552312
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
 
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