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Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763

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Reference TypeJournal (article/letter/editorial)
TitleAbout the origin of magnetoresistance in relatively thin metal films
JournalJournal of Materials Science
AuthorsTellier, C. R.Author
Tosser, A. J.Author
Pichard, C. R.Author
Year1981 (April)Volume16
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00542763Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9984991Long-form Identifiermindat:1:5:9984991:1
GUID0
Full ReferenceTellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Plain TextTellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
In(n.d.) Journal of Materials Science Vol. 16. Springer Science and Business Media LLC

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Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1981) Theoretical analysis of the Hall effect in thin polycrystalline metallic films. Journal of Materials Science, 16. 451-456 doi:10.1007/bf00738636
Pichard, C. R., Tosser, A. J., Tellier, C. R., Barua, K. C. (1981) Theoretical analysis of the transverse Hall effect in thin monocrystalline films. Journal of Materials Science, 16. 2480-2484 doi:10.1007/bf01113584
Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Tosser, A. J., Tellier, C. R., Pichard, C. R. (1981) Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering. Journal of Materials Science, 16. 944-948 doi:10.1007/bf00542738
Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Linear variations in conductivity with thickness of thin polycrystalline films. Journal of Materials Science, 15. 2236-2240 doi:10.1007/bf00552312
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1982) Graphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films. Journal of Materials Science, 17. 290-294 doi:10.1007/bf00809064
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
 
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