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Tellier, C. R., Pichard, C. R., Tosser, A. J. (1982) Graphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films. Journal of Materials Science, 17. 290-294 doi:10.1007/bf00809064

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Reference TypeJournal (article/letter/editorial)
TitleGraphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films
JournalJournal of Materials Science
AuthorsTellier, C. R.Author
Pichard, C. R.Author
Tosser, A. J.Author
Year1982 (January)Volume17
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00809064Search in ResearchGate
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Mindat Ref. ID9985265Long-form Identifiermindat:1:5:9985265:0
GUID0
Full ReferenceTellier, C. R., Pichard, C. R., Tosser, A. J. (1982) Graphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films. Journal of Materials Science, 17. 290-294 doi:10.1007/bf00809064
Plain TextTellier, C. R., Pichard, C. R., Tosser, A. J. (1982) Graphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films. Journal of Materials Science, 17. 290-294 doi:10.1007/bf00809064
In(n.d.) Journal of Materials Science Vol. 17. Springer Science and Business Media LLC

See Also

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Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Pichard, C. R., Tosser, A. J., Tellier, C. R., Barua, K. C. (1981) Theoretical analysis of the transverse Hall effect in thin monocrystalline films. Journal of Materials Science, 16. 2480-2484 doi:10.1007/bf01113584
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
Deschacht, D., Boyer, A., Groubert, E., Pichard, C. R., Tosser, A. T., Tellier, C. R. (1982) Consequence of electron scattering mechanisms on the conductivity of semi-metal films. Journal of Materials Science, 17. 2753-2756 doi:10.1007/bf00543913
Pichard, C R, Tellier, C R, Tosser, A J (1980) Thermoelectric power of thin polycrystalline metal films in an effective mean free path model. Journal of Physics F: Metal Physics, 10 (9). 2009-2014 doi:10.1088/0305-4608/10/9/016
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1981) Theoretical analysis of the Hall effect in thin polycrystalline metallic films. Journal of Materials Science, 16. 451-456 doi:10.1007/bf00738636
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
 
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