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Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371

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Reference TypeJournal (article/letter/editorial)
TitleSimple equations for the conductivity of thin metal films with unlike surfaces
JournalJournal of Materials Science Letters
AuthorsGuendouz, L.Author
Tellier, C. R.Author
Tosser, A. J.Author
Pichard, C. R.Author
Year1984 (May)Volume3
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00724371Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16408895Long-form Identifiermindat:1:5:16408895:5
GUID0
Full ReferenceGuendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Plain TextGuendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
In(1984, May) Journal of Materials Science Letters Vol. 3 (5) Springer Science and Business Media LLC

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Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Linear variations in conductivity with thickness of thin polycrystalline films. Journal of Materials Science, 15. 2236-2240 doi:10.1007/bf00552312
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Tellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Richard, C. R., Guendouz, L., Tosser, A. J., Tellier, C. R. (1984) A reinterpretation of the effects of impurities on the thermoelectric power of thin gold films. Journal of Materials Science, 19. 3940-3944 doi:10.1007/bf00980757
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Pichard, C. R., Tellier, C. R., Bedda, M., Tosser, A. J. (1984) Theoretical remarks about the transverse Hall effect in metal films at high magnetic field. Journal of Materials Science Letters, 3 (9) 783-785 doi:10.1007/bf00727972
 
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