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Tosser, A. J., Pichard, C. R., Lahrichi, M., Bedda, M. (1985) Simple calculation of the Hall coefficient of thin metal films. Journal of Materials Science Letters, 4 (5) 585-588 doi:10.1007/bf00720039

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Reference TypeJournal (article/letter/editorial)
TitleSimple calculation of the Hall coefficient of thin metal films
JournalJournal of Materials Science Letters
AuthorsTosser, A. J.Author
Pichard, C. R.Author
Lahrichi, M.Author
Bedda, M.Author
Year1985 (May)Volume4
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00720039Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16409310Long-form Identifiermindat:1:5:16409310:2
GUID0
Full ReferenceTosser, A. J., Pichard, C. R., Lahrichi, M., Bedda, M. (1985) Simple calculation of the Hall coefficient of thin metal films. Journal of Materials Science Letters, 4 (5) 585-588 doi:10.1007/bf00720039
Plain TextTosser, A. J., Pichard, C. R., Lahrichi, M., Bedda, M. (1985) Simple calculation of the Hall coefficient of thin metal films. Journal of Materials Science Letters, 4 (5) 585-588 doi:10.1007/bf00720039
In(1985, May) Journal of Materials Science Letters Vol. 4 (5) Springer Science and Business Media LLC

See Also

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Pichard, C. R., Bedda, M., Lahrichi, M., Tosser, A. J. (1986) Electrical conduction and ordinary Hall effect in thin nickel films. Journal of Materials Science, 21. 469-474 doi:10.1007/bf01145510
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Pichard, C. R., Tellier, C. R., Bedda, M., Tosser, A. J. (1984) Theoretical remarks about the transverse Hall effect in metal films at high magnetic field. Journal of Materials Science Letters, 3 (9) 783-785 doi:10.1007/bf00727972
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
Pichard, C. R., Khalid-Naciri, A., Tosser, A. J. (1984) Checking the assumption related to the structure of thin metal films from the variations in the Hall coefficient. Journal of Materials Science Letters, 3 (5) 455-460 doi:10.1007/bf00724391
Messaadi, S., Pichard, C. R., Tosser, A. J. (1986) Effects of ageing procedure on the specular reflection coefficient of thin polycrystalline metal films. Journal of Materials Science Letters, 5 (10) 1036-1038 doi:10.1007/bf01730275
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Bedda, M., Messaadi, S., Pichard, C. R., Tosser, A. J. (1986) Analytical expression for the total electrical conductivity of unannealed and annealed metal films. Journal of Materials Science, 21. 2643-2647 doi:10.1007/bf00551466
Pichard, C. R., Bedda, M., Vatamanyuk, V. I., Tosser, A. J., Tellier, C. R. (1985) Alternative analytical forms of the Fuchs-Sondheimer function. Journal of Materials Science, 20. 4185-4201 doi:10.1007/bf00552414
Pichard, C. R., Vatamanyuk, V. I., Khalid-Naciri, A., Tellier, C. R., Tosser, A. J. (1984) The theoretical values for the resistivity, the tcr and the Hall coefficient of thin columnar and polycrystalline films. Journal of Materials Science Letters, 3 (5) 447-450 doi:10.1007/bf00724389
Tijani, H., Pichard, C. R., Tosser, A. J., Messaadi, S. (1987) Simple analysis of the Iongitudinal magnetoresistance of thin metal wires. Journal of Materials Science Letters, 6 (5) 552-554 doi:10.1007/bf01739281
 
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