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Pichard, C. R., Khalid-Naciri, A., Tosser, A. J. (1984) Checking the assumption related to the structure of thin metal films from the variations in the Hall coefficient. Journal of Materials Science Letters, 3 (5) 455-460 doi:10.1007/bf00724391

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Reference TypeJournal (article/letter/editorial)
TitleChecking the assumption related to the structure of thin metal films from the variations in the Hall coefficient
JournalJournal of Materials Science Letters
AuthorsPichard, C. R.Author
Khalid-Naciri, A.Author
Tosser, A. J.Author
Year1984 (May)Volume3
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00724391Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16408909Long-form Identifiermindat:1:5:16408909:9
GUID0
Full ReferencePichard, C. R., Khalid-Naciri, A., Tosser, A. J. (1984) Checking the assumption related to the structure of thin metal films from the variations in the Hall coefficient. Journal of Materials Science Letters, 3 (5) 455-460 doi:10.1007/bf00724391
Plain TextPichard, C. R., Khalid-Naciri, A., Tosser, A. J. (1984) Checking the assumption related to the structure of thin metal films from the variations in the Hall coefficient. Journal of Materials Science Letters, 3 (5) 455-460 doi:10.1007/bf00724391
In(1984, May) Journal of Materials Science Letters Vol. 3 (5) Springer Science and Business Media LLC

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Pichard, C. R., Vatamanyuk, V. I., Khalid-Naciri, A., Tellier, C. R., Tosser, A. J. (1984) The theoretical values for the resistivity, the tcr and the Hall coefficient of thin columnar and polycrystalline films. Journal of Materials Science Letters, 3 (5) 447-450 doi:10.1007/bf00724389
Tosser, A. J., Pichard, C. R., Lahrichi, M., Bedda, M. (1985) Simple calculation of the Hall coefficient of thin metal films. Journal of Materials Science Letters, 4 (5) 585-588 doi:10.1007/bf00720039
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1982) Expression of Hall coefficient of thin metal films in the presence of impurity effects. Journal of Materials Science Letters, 1 (10) 423-425 doi:10.1007/bf00724860
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Messaadi, S., Pichard, C. R., Tosser, A. J. (1986) Effects of ageing procedure on the specular reflection coefficient of thin polycrystalline metal films. Journal of Materials Science Letters, 5 (10) 1036-1038 doi:10.1007/bf01730275
Pichard, C. R., Tellier, C. R., Bedda, M., Tosser, A. J. (1984) Theoretical remarks about the transverse Hall effect in metal films at high magnetic field. Journal of Materials Science Letters, 3 (9) 783-785 doi:10.1007/bf00727972
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1981) Theoretical analysis of the Hall effect in thin polycrystalline metallic films. Journal of Materials Science, 16. 451-456 doi:10.1007/bf00738636
Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Pichard, C. R., Tosser, A. J., Tellier, C. R., Barua, K. C. (1981) Theoretical analysis of the transverse Hall effect in thin monocrystalline films. Journal of Materials Science, 16. 2480-2484 doi:10.1007/bf01113584
 
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