Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Kumar, Arul, Komalan, Manu P., Lenka, Haraprasanna, Kambham, Ajay Kumar, Gilbert, Matthieu, Gencarelli, Federica, Vincent, Benjamin, Vandervorst, Wilfried (2013) Atomic insight into Ge1−xSnx using atom probe tomography. Ultramicroscopy, 132. 171-178 doi:10.1016/j.ultramic.2013.02.009

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleAtomic insight into Ge1−xSnx using atom probe tomography
JournalUltramicroscopy
AuthorsKumar, ArulAuthor
Komalan, Manu P.Author
Lenka, HaraprasannaAuthor
Kambham, Ajay KumarAuthor
Gilbert, MatthieuAuthor
Gencarelli, FedericaAuthor
Vincent, BenjaminAuthor
Vandervorst, WilfriedAuthor
Year2013 (September)Volume132
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2013.02.009Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4908369Long-form Identifiermindat:1:5:4908369:9
GUID0
Full ReferenceKumar, Arul, Komalan, Manu P., Lenka, Haraprasanna, Kambham, Ajay Kumar, Gilbert, Matthieu, Gencarelli, Federica, Vincent, Benjamin, Vandervorst, Wilfried (2013) Atomic insight into Ge1−xSnx using atom probe tomography. Ultramicroscopy, 132. 171-178 doi:10.1016/j.ultramic.2013.02.009
Plain TextKumar, Arul, Komalan, Manu P., Lenka, Haraprasanna, Kambham, Ajay Kumar, Gilbert, Matthieu, Gencarelli, Federica, Vincent, Benjamin, Vandervorst, Wilfried (2013) Atomic insight into Ge1−xSnx using atom probe tomography. Ultramicroscopy, 132. 171-178 doi:10.1016/j.ultramic.2013.02.009
In(2013) Ultramicroscopy Vol. 132. Elsevier BV

See Also

These are possibly similar items as determined by title/reference text matching only.

Kumar, Arul, Gencarelli, Federica, Kambham, Ajay Kumar, Gilbert, Matthieu, Vincent, Benjamin, Vandervorst, Wilfried (2012) Study of Sn migration during relaxation of Ge1-xSnxlayers using atom probe tomography. physica status solidi (c), 9 (10). 1924-1930 doi:10.1002/pssc.201200222
Kambham, Ajay Kumar, Kumar, Arul, Gilbert, Matthieu, Vandervorst, Wilfried (2013) 3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography. Ultramicroscopy, 132. 65-69 doi:10.1016/j.ultramic.2012.09.013
Kambham, A.K., Mody, J., Gilbert, M., Koelling, S., Vandervorst, W. (2011) Atom-probe for FinFET dopant characterization. Ultramicroscopy, 111 (6). 535-539 doi:10.1016/j.ultramic.2011.01.017
Vandervorst, Wilfried, Schulze, Andreas, Kambham, Ajay Kumar, Mody, Jay, Gilbert, Matthieu, Eyben, Pierre (2014) Dopant/carrier profiling for 3D-structures. physica status solidi (c), 11 (1). 121-129 doi:10.1002/pssc.201300329
Gilbert, M., Vandervorst, W., Koelling, S., Kambham, A.K. (2011) Atom probe analysis of a 3D finFET with high-k metal gate. Ultramicroscopy, 111 (6). 530-534 doi:10.1016/j.ultramic.2010.12.025
Koelling, S., Innocenti, N., Bogdanowicz, J., Vandervorst, W. (2013) Optimal laser positioning for laser-assisted atom probe tomography. Ultramicroscopy, 132. 70-74 doi:10.1016/j.ultramic.2013.03.003
Bogdanowicz, J., Kumar, A., Fleischmann, C., Gilbert, M., Houard, J., Vella, A., Vandervorst, W. (2018) Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation. Ultramicroscopy, 188. 19-23 doi:10.1016/j.ultramic.2018.03.001
Koelling, S., Innocenti, N., Hellings, G., Gilbert, M., Kambham, A.K., De Meyer, K., Vandervorst, W. (2011) Characteristics of cross-sectional atom probe analysis on semiconductor structures. Ultramicroscopy, 111 (6). 540-545 doi:10.1016/j.ultramic.2011.01.004
Weidow, Jonathan (2013) Atom probe tomography analysis of WC powder. Ultramicroscopy, 132. 295-299 doi:10.1016/j.ultramic.2013.01.008
Fleischmann, Claudia, Paredis, Kristof, Melkonyan, Davit, Vandervorst, Wilfried (2018) Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy. Ultramicroscopy, 194. 221-226 doi:10.1016/j.ultramic.2018.08.010
Marceau, R.K.W., Choi, P., Raabe, D. (2013) Understanding the detection of carbon in austenitic high-Mn steel using atom probe tomography. Ultramicroscopy, 132. 239-247 doi:10.1016/j.ultramic.2013.01.010
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 14, 2025 03:15:47
Go to top of page