Fang, Zhong-Hui, Jiang, Xiao-Fan, Chen, Kun-Ji, Wang, Yue-Fei, Li, Wei, Xu, Jun (2015) Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN x matrix by the influence of near-interface oxide traps. Chinese Physics B, 24. 17305pp. doi:10.1088/1674-1056/24/1/017305
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN x matrix by the influence of near-interface oxide traps | ||
| Journal | Chinese Physics B | ||
| Authors | Fang, Zhong-Hui | Author | |
| Jiang, Xiao-Fan | Author | ||
| Chen, Kun-Ji | Author | ||
| Wang, Yue-Fei | Author | ||
| Li, Wei | Author | ||
| Xu, Jun | Author | ||
| Year | 2015 (January) | Volume | 24 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/24/1/017305Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6005529 | Long-form Identifier | mindat:1:5:6005529:3 |
| GUID | 0 | ||
| Full Reference | Fang, Zhong-Hui, Jiang, Xiao-Fan, Chen, Kun-Ji, Wang, Yue-Fei, Li, Wei, Xu, Jun (2015) Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN x matrix by the influence of near-interface oxide traps. Chinese Physics B, 24. 17305pp. doi:10.1088/1674-1056/24/1/017305 | ||
| Plain Text | Fang, Zhong-Hui, Jiang, Xiao-Fan, Chen, Kun-Ji, Wang, Yue-Fei, Li, Wei, Xu, Jun (2015) Different charging behaviors between electrons and holes in Si nanocrystals embedded in SiN x matrix by the influence of near-interface oxide traps. Chinese Physics B, 24. 17305pp. doi:10.1088/1674-1056/24/1/017305 | ||
| In | (n.d.) Chinese Physics B Vol. 24. IOP Publishing | ||
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