Reference Type | Journal (article/letter/editorial) |
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Title | Role of remote Coulomb scattering on the hole mobility at cryogenic temperatures in SOI p-MOSFETs |
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Journal | Chinese Physics B |
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Authors | Zhang, Xian-Le | Author |
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Chang, Peng-Ying | Author |
Du, Gang | Author |
Liu, Xiao-Yan | Author |
Year | 2020 (February) | Volume | 29 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1674-1056/ab6966Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 6010714 | Long-form Identifier | mindat:1:5:6010714:3 |
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GUID | 0 |
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Full Reference | Zhang, Xian-Le, Chang, Peng-Ying, Du, Gang, Liu, Xiao-Yan (2020) Role of remote Coulomb scattering on the hole mobility at cryogenic temperatures in SOI p-MOSFETs. Chinese Physics B, 29. 38505pp. doi:10.1088/1674-1056/ab6966 |
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Plain Text | Zhang, Xian-Le, Chang, Peng-Ying, Du, Gang, Liu, Xiao-Yan (2020) Role of remote Coulomb scattering on the hole mobility at cryogenic temperatures in SOI p-MOSFETs. Chinese Physics B, 29. 38505pp. doi:10.1088/1674-1056/ab6966 |
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In | (n.d.) Chinese Physics B Vol. 29. IOP Publishing |
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