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Carter, G., Katardjiev, I. V., Nobes, M. J. (1989) An altered layer model for sputter-profiling. Surface and Interface Analysis, 14 (4). 194-208 doi:10.1002/sia.740140406

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Reference TypeJournal (article/letter/editorial)
TitleAn altered layer model for sputter-profiling
JournalSurface and Interface Analysis
AuthorsCarter, G.Author
Katardjiev, I. V.Author
Nobes, M. J.Author
Year1989 (April)Volume14
Issue4
PublisherWiley
DOIdoi:10.1002/sia.740140406Search in ResearchGate
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Mindat Ref. ID6502170Long-form Identifiermindat:1:5:6502170:5
GUID0
Full ReferenceCarter, G., Katardjiev, I. V., Nobes, M. J. (1989) An altered layer model for sputter-profiling. Surface and Interface Analysis, 14 (4). 194-208 doi:10.1002/sia.740140406
Plain TextCarter, G., Katardjiev, I. V., Nobes, M. J. (1989) An altered layer model for sputter-profiling. Surface and Interface Analysis, 14 (4). 194-208 doi:10.1002/sia.740140406
In(1989, April) Surface and Interface Analysis Vol. 14 (4) Wiley

See Also

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Carter, G., Katardjiev, I. V., Nobes, M. J. (1989) The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profiles. Surface and Interface Analysis, 14 (9). 511-523 doi:10.1002/sia.740140905
Carter, G., Nobes, M. J., Katardjiev, I. V. (1990) The effect of atomic-scale etch pit formation on depth resolution in sputter profiling. Surface and Interface Analysis, 15 (7). 447-450 doi:10.1002/sia.740150709
Katardjiev, I. V., Nobes, M. J., Carter, G. (1989) The precise determination of concentration distributions using depth-sectioning methods. Surface and Interface Analysis, 14 (9). 572-574 doi:10.1002/sia.740140914
Carter, G., Nobes, M. J., Stoere, H., Katardjiev, I. V. (1993) The evolution of atomic scale topography by sputtering erosion. Surface and Interface Analysis, 20 (1). 90-94 doi:10.1002/sia.740200113
Carter, G., Nobes, M. J., Lewis, G. W., Brown, C. R. (1985) The effect of surface topography evolution on sputter profiling depth resolution in Si. Surface and Interface Analysis, 7 (1). 35-40 doi:10.1002/sia.740070108
Carter, G., Nobes, M. J., Katardjiev, I. V. (1992) Sputter polishing of surfaces. Philosophical Magazine B, 66 (3). 419-425 doi:10.1080/13642819208207660
Carter, G., Nobes, M. J. (1992) Ion-beam-induced topography and compositional changes in depth profiling. Surface and Interface Analysis, 19 (1). 39-49 doi:10.1002/sia.740190111
Carter, G., Nobes, M. J., Katardjiev, I. V., Smith, R. (1989) The evolution of gradient discontinuities (edges) on sputter-eroded surfaces. Philosophical Magazine B, 59 (6). 619-636 doi:10.1080/13642818908211181
Mitchell, D. F., Arlow, J. S., Phillips, J. R., Sproule, G. I. (1989) Optimized ion beam raster for SIMS sputter depth profiling. Surface and Interface Analysis, 14 (6). 302-306 doi:10.1002/sia.740140606
Carter, G., Katardjiev, I. V., Nobes, M. J. (1991) Reproducibility and stability in surface morphological evolution. Philosophical Magazine B, 63 (4). 849-866 doi:10.1080/13642819108205542
Lewis, G. W., Kiriakides, G., Carter, G., Nobes, M. J. (1982) Ion bombardment induced surface topography modification of clean and contaminated single crystal Cu and Si. Surface and Interface Analysis, 4 (4). 141-150 doi:10.1002/sia.740040404
 
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