Terashima, Shinichi, Tanaka, Masamoto (2004) Thermal Fatigue Properties of Sn-1.2Ag-0.5Cu-xNi Flip Chip Interconnects. MATERIALS TRANSACTIONS, 45 (3). 681-688 doi:10.2320/matertrans.45.681
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Thermal Fatigue Properties of Sn-1.2Ag-0.5Cu-xNi Flip Chip Interconnects | ||
Journal | MATERIALS TRANSACTIONS | ||
Authors | Terashima, Shinichi | Author | |
Tanaka, Masamoto | Author | ||
Year | 2004 | Volume | 45 |
Issue | 3 | ||
Publisher | Japan Institute of Metals | ||
DOI | doi:10.2320/matertrans.45.681Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7777375 | Long-form Identifier | mindat:1:5:7777375:9 |
GUID | 0 | ||
Full Reference | Terashima, Shinichi, Tanaka, Masamoto (2004) Thermal Fatigue Properties of Sn-1.2Ag-0.5Cu-xNi Flip Chip Interconnects. MATERIALS TRANSACTIONS, 45 (3). 681-688 doi:10.2320/matertrans.45.681 | ||
Plain Text | Terashima, Shinichi, Tanaka, Masamoto (2004) Thermal Fatigue Properties of Sn-1.2Ag-0.5Cu-xNi Flip Chip Interconnects. MATERIALS TRANSACTIONS, 45 (3). 681-688 doi:10.2320/matertrans.45.681 | ||
In | (2004) MATERIALS TRANSACTIONS Vol. 45 (3) Japan Institute of Metals |
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