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Tan, K. L., Lundstrom, M. S., Melloch, M. R. (1986) Effect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions. Applied Physics Letters, 48 (6). 428-430 doi:10.1063/1.96520

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Reference TypeJournal (article/letter/editorial)
TitleEffect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions
JournalApplied Physics Letters
AuthorsTan, K. L.Author
Lundstrom, M. S.Author
Melloch, M. R.Author
Year1986 (February 10)Volume48
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.96520Search in ResearchGate
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Mindat Ref. ID8478051Long-form Identifiermindat:1:5:8478051:7
GUID0
Full ReferenceTan, K. L., Lundstrom, M. S., Melloch, M. R. (1986) Effect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions. Applied Physics Letters, 48 (6). 428-430 doi:10.1063/1.96520
Plain TextTan, K. L., Lundstrom, M. S., Melloch, M. R. (1986) Effect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions. Applied Physics Letters, 48 (6). 428-430 doi:10.1063/1.96520
In(1986, February) Applied Physics Letters Vol. 48 (6) AIP Publishing


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