Reference Type | Journal (article/letter/editorial) |
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Title | Effect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions |
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Journal | Applied Physics Letters |
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Authors | Tan, K. L. | Author |
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Lundstrom, M. S. | Author |
Melloch, M. R. | Author |
Year | 1986 (February 10) | Volume | 48 |
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Issue | 6 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.96520Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8478051 | Long-form Identifier | mindat:1:5:8478051:7 |
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GUID | 0 |
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Full Reference | Tan, K. L., Lundstrom, M. S., Melloch, M. R. (1986) Effect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions. Applied Physics Letters, 48 (6). 428-430 doi:10.1063/1.96520 |
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Plain Text | Tan, K. L., Lundstrom, M. S., Melloch, M. R. (1986) Effect of impurity trapping on the capacitance‐voltage characteristics ofn‐GaAs/N‐AlGaAs heterojunctions. Applied Physics Letters, 48 (6). 428-430 doi:10.1063/1.96520 |
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In | (1986, February) Applied Physics Letters Vol. 48 (6) AIP Publishing |
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