Reference Type | Journal (article/letter/editorial) |
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Title | Raman study of an epitaxial GaAs layer on a Si [100] substrate |
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Journal | Applied Physics Letters |
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Authors | Huang, Yihe | Author |
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Yu, Peter Y. | Author |
Charasse, Marie‐Noelle | Author |
Lo, Yuhua | Author |
Wang, Shyh | Author |
Year | 1987 (July 20) | Volume | 51 |
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Issue | 3 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.98919Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8481983 | Long-form Identifier | mindat:1:5:8481983:7 |
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GUID | 0 |
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Full Reference | Huang, Yihe, Yu, Peter Y., Charasse, Marie‐Noelle, Lo, Yuhua, Wang, Shyh (1987) Raman study of an epitaxial GaAs layer on a Si [100] substrate. Applied Physics Letters, 51 (3). 192-194 doi:10.1063/1.98919 |
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Plain Text | Huang, Yihe, Yu, Peter Y., Charasse, Marie‐Noelle, Lo, Yuhua, Wang, Shyh (1987) Raman study of an epitaxial GaAs layer on a Si [100] substrate. Applied Physics Letters, 51 (3). 192-194 doi:10.1063/1.98919 |
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In | (1987, July) Applied Physics Letters Vol. 51 (3) AIP Publishing |
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