Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of GaAs film grown on Si substrate by photoluminescence at 77 K |
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Journal | Applied Physics Letters |
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Authors | Huang, Yihe | Author |
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Yu, Peter Y. | Author |
Lee, Henry | Author |
Wang, Shyh | Author |
Year | 1988 (February 15) | Volume | 52 |
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Issue | 7 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.99371Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8483766 | Long-form Identifier | mindat:1:5:8483766:6 |
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GUID | 0 |
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Full Reference | Huang, Yihe, Yu, Peter Y., Lee, Henry, Wang, Shyh (1988) Characterization of GaAs film grown on Si substrate by photoluminescence at 77 K. Applied Physics Letters, 52 (7). 579-581 doi:10.1063/1.99371 |
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Plain Text | Huang, Yihe, Yu, Peter Y., Lee, Henry, Wang, Shyh (1988) Characterization of GaAs film grown on Si substrate by photoluminescence at 77 K. Applied Physics Letters, 52 (7). 579-581 doi:10.1063/1.99371 |
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In | (1988, February) Applied Physics Letters Vol. 52 (7) AIP Publishing |
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