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Cheeks, T. L., Roukes, M. L., Scherer, A., Craighead, H. G. (1988) Narrow conducting channels defined by helium ion beam damage. Applied Physics Letters, 53 (20). 1964-1966 doi:10.1063/1.100337

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Reference TypeJournal (article/letter/editorial)
TitleNarrow conducting channels defined by helium ion beam damage
JournalApplied Physics Letters
AuthorsCheeks, T. L.Author
Roukes, M. L.Author
Scherer, A.Author
Craighead, H. G.Author
Year1988 (November 14)Volume53
Issue20
PublisherAIP Publishing
DOIdoi:10.1063/1.100337Search in ResearchGate
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Mindat Ref. ID8484806Long-form Identifiermindat:1:5:8484806:0
GUID0
Full ReferenceCheeks, T. L., Roukes, M. L., Scherer, A., Craighead, H. G. (1988) Narrow conducting channels defined by helium ion beam damage. Applied Physics Letters, 53 (20). 1964-1966 doi:10.1063/1.100337
Plain TextCheeks, T. L., Roukes, M. L., Scherer, A., Craighead, H. G. (1988) Narrow conducting channels defined by helium ion beam damage. Applied Physics Letters, 53 (20). 1964-1966 doi:10.1063/1.100337
In(1988, November) Applied Physics Letters Vol. 53 (20) AIP Publishing


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