Reference Type | Journal (article/letter/editorial) |
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Title | Narrow conducting channels defined by helium ion beam damage |
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Journal | Applied Physics Letters |
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Authors | Cheeks, T. L. | Author |
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Roukes, M. L. | Author |
Scherer, A. | Author |
Craighead, H. G. | Author |
Year | 1988 (November 14) | Volume | 53 |
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Issue | 20 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.100337Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8484806 | Long-form Identifier | mindat:1:5:8484806:0 |
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|
GUID | 0 |
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Full Reference | Cheeks, T. L., Roukes, M. L., Scherer, A., Craighead, H. G. (1988) Narrow conducting channels defined by helium ion beam damage. Applied Physics Letters, 53 (20). 1964-1966 doi:10.1063/1.100337 |
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Plain Text | Cheeks, T. L., Roukes, M. L., Scherer, A., Craighead, H. G. (1988) Narrow conducting channels defined by helium ion beam damage. Applied Physics Letters, 53 (20). 1964-1966 doi:10.1063/1.100337 |
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In | (1988, November) Applied Physics Letters Vol. 53 (20) AIP Publishing |
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