Reference Type | Journal (article/letter/editorial) |
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Title | Cathodoluminescence measurement of an orientation dependent aluminum concentration in AlxGa1−xAs epilayers grown by molecular beam epitaxy on a nonplanar substrate |
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Journal | Applied Physics Letters |
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Authors | Hoenk, Michael E. | Author |
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Chen, Howard Z. | Author |
Yariv, Amnon | Author |
Morkoç, Hadis | Author |
Vahala, Kerry J. | Author |
Year | 1989 (April 3) | Volume | 54 |
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Issue | 14 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.100711Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8486172 | Long-form Identifier | mindat:1:5:8486172:4 |
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GUID | 0 |
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Full Reference | Hoenk, Michael E., Chen, Howard Z., Yariv, Amnon, Morkoç, Hadis, Vahala, Kerry J. (1989) Cathodoluminescence measurement of an orientation dependent aluminum concentration in AlxGa1−xAs epilayers grown by molecular beam epitaxy on a nonplanar substrate. Applied Physics Letters, 54 (14). 1347-1349 doi:10.1063/1.100711 |
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Plain Text | Hoenk, Michael E., Chen, Howard Z., Yariv, Amnon, Morkoç, Hadis, Vahala, Kerry J. (1989) Cathodoluminescence measurement of an orientation dependent aluminum concentration in AlxGa1−xAs epilayers grown by molecular beam epitaxy on a nonplanar substrate. Applied Physics Letters, 54 (14). 1347-1349 doi:10.1063/1.100711 |
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In | (1989, April) Applied Physics Letters Vol. 54 (14) AIP Publishing |
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