Reference Type | Journal (article/letter/editorial) |
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Title | Incidence angle effect of a hydrogen plasma beam for the cleaning of semiconductor surfaces |
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Journal | Applied Physics Letters |
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Authors | Suemune, I. | Author |
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Kunitsugu, Y. | Author |
Kan, Y. | Author |
Yamanishi, M. | Author |
Year | 1989 (August 21) | Volume | 55 |
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Issue | 8 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.101798Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8489411 | Long-form Identifier | mindat:1:5:8489411:1 |
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GUID | 0 |
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Full Reference | Suemune, I., Kunitsugu, Y., Kan, Y., Yamanishi, M. (1989) Incidence angle effect of a hydrogen plasma beam for the cleaning of semiconductor surfaces. Applied Physics Letters, 55 (8). 760-762 doi:10.1063/1.101798 |
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Plain Text | Suemune, I., Kunitsugu, Y., Kan, Y., Yamanishi, M. (1989) Incidence angle effect of a hydrogen plasma beam for the cleaning of semiconductor surfaces. Applied Physics Letters, 55 (8). 760-762 doi:10.1063/1.101798 |
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In | (1989, August) Applied Physics Letters Vol. 55 (8) AIP Publishing |
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