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Tilak, Vinayak, Batoni, Paolo, Jiang, Jie, Knobloch, Aaron (2007) Measurement of piezoelectric coefficient of gallium nitride using metal-insulator-semiconductor capacitors. Applied Physics Letters, 90 (4). 43508pp. doi:10.1063/1.2434180

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of piezoelectric coefficient of gallium nitride using metal-insulator-semiconductor capacitors
JournalApplied Physics Letters
AuthorsTilak, VinayakAuthor
Batoni, PaoloAuthor
Jiang, JieAuthor
Knobloch, AaronAuthor
Year2007 (January 22)Volume90
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.2434180Search in ResearchGate
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Mindat Ref. ID8555057Long-form Identifiermindat:1:5:8555057:9
GUID0
Full ReferenceTilak, Vinayak, Batoni, Paolo, Jiang, Jie, Knobloch, Aaron (2007) Measurement of piezoelectric coefficient of gallium nitride using metal-insulator-semiconductor capacitors. Applied Physics Letters, 90 (4). 43508pp. doi:10.1063/1.2434180
Plain TextTilak, Vinayak, Batoni, Paolo, Jiang, Jie, Knobloch, Aaron (2007) Measurement of piezoelectric coefficient of gallium nitride using metal-insulator-semiconductor capacitors. Applied Physics Letters, 90 (4). 43508pp. doi:10.1063/1.2434180
In(2007, January) Applied Physics Letters Vol. 90 (4) AIP Publishing

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Matocha, Kevin, Chow, T. Paul, Gutmann, Ronald J. (2002) Gallium Nitride Metal-Insulator-Semiconductor Capacitors Using Low-Pressure Chemical Vapor Deposited Oxides. Materials Science Forum, 389. 1535pp. doi:10.4028/www.scientific.net/msf.389-393.1535
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