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Chen, M, Wang, X, Yu, Y.H, Pei, Z.L, Bai, X.D, Sun, C, Huang, R.F, Wen, L.S (2000) X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films. Applied Surface Science, 158. 134-140 doi:10.1016/s0169-4332(99)00601-7

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Reference TypeJournal (article/letter/editorial)
TitleX-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films
JournalApplied Surface Science
AuthorsChen, MAuthor
Wang, XAuthor
Yu, Y.HAuthor
Pei, Z.LAuthor
Bai, X.DAuthor
Sun, CAuthor
Huang, R.FAuthor
Wen, L.SAuthor
Year2000 (May)Volume158
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00601-7Search in ResearchGate
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Mindat Ref. ID9901850Long-form Identifiermindat:1:5:9901850:2
GUID0
Full ReferenceChen, M, Wang, X, Yu, Y.H, Pei, Z.L, Bai, X.D, Sun, C, Huang, R.F, Wen, L.S (2000) X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films. Applied Surface Science, 158. 134-140 doi:10.1016/s0169-4332(99)00601-7
Plain TextChen, M, Wang, X, Yu, Y.H, Pei, Z.L, Bai, X.D, Sun, C, Huang, R.F, Wen, L.S (2000) X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films. Applied Surface Science, 158. 134-140 doi:10.1016/s0169-4332(99)00601-7
In(n.d.) Applied Surface Science Vol. 158. Elsevier BV

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Chen, M., Pei, Z.L., Sun, C., Wen, L.S., Wang, X. (2000) Surface characterization of transparent conductive oxide Al-doped ZnO films. Journal of Crystal Growth, 220 (3). 254-262 doi:10.1016/s0022-0248(00)00834-4
Seah, M.P (1999) Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined. Applied Surface Science, 144. 161-167 doi:10.1016/s0169-4332(98)00788-0
Chen, M., Pei, Z.L., Sun, C., Wen, L.S., Wang, X. (2001) Formation of Al-doped ZnO films by dc magnetron reactive sputtering. Materials Letters, 48. 194-198 doi:10.1016/s0167-577x(00)00302-5
Cao, H.T., Pei, Z.L., Gong, J., Sun, C., Huang, R.F., Wen, L.S. (2004) Preparation and characterization of Al and Mn doped ZnO (ZnO: (Al, Mn)) transparent conducting oxide films. Journal of Solid State Chemistry, 177. 1480-1487 doi:10.1016/j.jssc.2003.11.030
Debnath, R.K, Fitzgerald, A.G, Christova, K (2002) X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40−xS60 films. Applied Surface Science, 202. 261-265 doi:10.1016/s0169-4332(02)00946-7
POWELL, C, JABLONSKI, A, WERNER, W, SMEKAL, W (2005) Corrigendum to “Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy”[Applied Surface Science 239 (2005) 470–480]. Applied Surface Science, 242. 219pp. doi:10.1016/s0169-4332(05)00046-2
Nasser, Seif A (2000) X-ray photoelectron spectroscopy study on the composition and structure of BaTiO3 thin films deposited on silicon. Applied Surface Science, 157. 14-22 doi:10.1016/s0169-4332(99)00495-x
Komolov, Alexei, Schaumburg, Kjeld, Møller, Preben J, Monakhov, Vadim (1999) Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage. Applied Surface Science, 142. 591-597 doi:10.1016/s0169-4332(98)00924-6
Sain, Mohini (2000) X-ray photoelectron spectroscopy study of ultrathin-film-forming chemical-precursor-engineered lignocellulosic fiber and fiber-mat surfaces. Applied Surface Science, 158. 92-103 doi:10.1016/s0169-4332(99)00592-9
Lai, B, Ding, X.M, Yuan, Z.L, Zhou, X, Liao, L.S, Zhang, S.K, Yuan, S, Hou, X.Y, Lu, E.D, Xu, P.S, Zhang, X.Y (2000) Synchrotron radiation photoelectron spectroscopy study of ITO surface. Applied Surface Science, 157. 35-38 doi:10.1016/s0169-4332(99)00515-2
Lesiak, Beata, Zemek, Jozef, Jozwik, Adam (1998) Phase distinction in semi-insulating polycrystalline silicon by pattern recognition of X-ray photoelectron spectroscopy/X-ray-induced Auger electron spectroscopy data. Applied Surface Science, 135. 318-330 doi:10.1016/s0169-4332(98)00289-x
 
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