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Capitán, M.J, Stabel, A, Sánchez-López, J.C, Justo, A, González-Elipe, A.R, Lefebvre, S, Fernández, A (2000) Characterization of mixed Ti/Al oxide thin films prepared by ion-beam-induced CVD. Applied Surface Science, 161. 209-218 doi:10.1016/s0169-4332(00)00293-2

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of mixed Ti/Al oxide thin films prepared by ion-beam-induced CVD
JournalApplied Surface Science
AuthorsCapitán, M.JAuthor
Stabel, AAuthor
Sánchez-López, J.CAuthor
Justo, AAuthor
González-Elipe, A.RAuthor
Lefebvre, SAuthor
Fernández, AAuthor
Year2000 (July)Volume161
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(00)00293-2Search in ResearchGate
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Mindat Ref. ID9902008Long-form Identifiermindat:1:5:9902008:4
GUID0
Full ReferenceCapitán, M.J, Stabel, A, Sánchez-López, J.C, Justo, A, González-Elipe, A.R, Lefebvre, S, Fernández, A (2000) Characterization of mixed Ti/Al oxide thin films prepared by ion-beam-induced CVD. Applied Surface Science, 161. 209-218 doi:10.1016/s0169-4332(00)00293-2
Plain TextCapitán, M.J, Stabel, A, Sánchez-López, J.C, Justo, A, González-Elipe, A.R, Lefebvre, S, Fernández, A (2000) Characterization of mixed Ti/Al oxide thin films prepared by ion-beam-induced CVD. Applied Surface Science, 161. 209-218 doi:10.1016/s0169-4332(00)00293-2
In(n.d.) Applied Surface Science Vol. 161. Elsevier BV

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Caballero, A., Leinen, D., Fernández, A., Justo, A., Espinós, J. P., González‐Elipe, A. R. (1995) Contribution of the x‐ray absorption spectroscopy to study TiO2thin films prepared by ion beam induced chemical vapor deposition. Journal of Applied Physics, 77 (2). 591-597 doi:10.1063/1.359043
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