Sun, Wei-Wei, Zheng, Xue-Feng, Fan, Shuang, Wang, Chong, Du, Ming, Zhang, Kai, Chen, Wei-Wei, Cao, Yan-Rong, Mao, Wei, Ma, Xiao-Hua, Zhang, Jin-Cheng, Hao, Yue (2015) Degradation mechanism of enhancement-mode AlGaN/GaN HEMTs using fluorine ion implantation under the on-state gate overdrive stress. Chinese Physics B, 24. 17303pp. doi:10.1088/1674-1056/24/1/017303
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Degradation mechanism of enhancement-mode AlGaN/GaN HEMTs using fluorine ion implantation under the on-state gate overdrive stress | ||
| Journal | Chinese Physics B | ||
| Authors | Sun, Wei-Wei | Author | |
| Zheng, Xue-Feng | Author | ||
| Fan, Shuang | Author | ||
| Wang, Chong | Author | ||
| Du, Ming | Author | ||
| Zhang, Kai | Author | ||
| Chen, Wei-Wei | Author | ||
| Cao, Yan-Rong | Author | ||
| Mao, Wei | Author | ||
| Ma, Xiao-Hua | Author | ||
| Zhang, Jin-Cheng | Author | ||
| Hao, Yue | Author | ||
| Year | 2015 (January) | Volume | 24 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/24/1/017303Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6005527 | Long-form Identifier | mindat:1:5:6005527:5 |
| GUID | 0 | ||
| Full Reference | Sun, Wei-Wei, Zheng, Xue-Feng, Fan, Shuang, Wang, Chong, Du, Ming, Zhang, Kai, Chen, Wei-Wei, Cao, Yan-Rong, Mao, Wei, Ma, Xiao-Hua, Zhang, Jin-Cheng, Hao, Yue (2015) Degradation mechanism of enhancement-mode AlGaN/GaN HEMTs using fluorine ion implantation under the on-state gate overdrive stress. Chinese Physics B, 24. 17303pp. doi:10.1088/1674-1056/24/1/017303 | ||
| Plain Text | Sun, Wei-Wei, Zheng, Xue-Feng, Fan, Shuang, Wang, Chong, Du, Ming, Zhang, Kai, Chen, Wei-Wei, Cao, Yan-Rong, Mao, Wei, Ma, Xiao-Hua, Zhang, Jin-Cheng, Hao, Yue (2015) Degradation mechanism of enhancement-mode AlGaN/GaN HEMTs using fluorine ion implantation under the on-state gate overdrive stress. Chinese Physics B, 24. 17303pp. doi:10.1088/1674-1056/24/1/017303 | ||
| In | (n.d.) Chinese Physics B Vol. 24. IOP Publishing | ||
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