Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., Edge, L. F., Schlom, D. G., Stevie, F. A., Garcia, R., Zhu, Z., Griffis, D. P. (2006) Thermal stability of lanthanum scandate dielectrics on Si(100). Applied Physics Letters, 89 (24). 242907pp. doi:10.1063/1.2405418
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Thermal stability of lanthanum scandate dielectrics on Si(100) | ||
| Journal | Applied Physics Letters | ||
| Authors | Sivasubramani, P. | Author | |
| Lee, T. H. | Author | ||
| Kim, M. J. | Author | ||
| Kim, J. | Author | ||
| Gnade, B. E. | Author | ||
| Wallace, R. M. | Author | ||
| Edge, L. F. | Author | ||
| Schlom, D. G. | Author | ||
| Stevie, F. A. | Author | ||
| Garcia, R. | Author | ||
| Zhu, Z. | Author | ||
| Griffis, D. P. | Author | ||
| Year | 2006 (December 11) | Volume | 89 |
| Issue | 24 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2405418Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8551388 | Long-form Identifier | mindat:1:5:8551388:8 |
| GUID | 0 | ||
| Full Reference | Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., Edge, L. F., Schlom, D. G., Stevie, F. A., Garcia, R., Zhu, Z., Griffis, D. P. (2006) Thermal stability of lanthanum scandate dielectrics on Si(100). Applied Physics Letters, 89 (24). 242907pp. doi:10.1063/1.2405418 | ||
| Plain Text | Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., Edge, L. F., Schlom, D. G., Stevie, F. A., Garcia, R., Zhu, Z., Griffis, D. P. (2006) Thermal stability of lanthanum scandate dielectrics on Si(100). Applied Physics Letters, 89 (24). 242907pp. doi:10.1063/1.2405418 | ||
| In | (2006, December) Applied Physics Letters Vol. 89 (24) AIP Publishing | ||
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