Kim, Hyun-Suk, Park, Kyung-Bae, Son, Kyoung Seok, Park, Joon Seok, Maeng, Wan-Joo, Kim, Tae Sang, Lee, Kwang-Hee, Kim, Eok Su, Lee, Jiyoul, Suh, Joonki, Seon, Jong-Baek, Ryu, Myung Kwan, Lee, Sang Yoon, Lee, Kimoon, Im, Seongil (2010) The influence of sputtering power and O2/Ar flow ratio on the performance and stability of Hf–In–Zn–O thin film transistors under illumination. Applied Physics Letters, 97 (10). 102103pp. doi:10.1063/1.3488823
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | The influence of sputtering power and O2/Ar flow ratio on the performance and stability of Hf–In–Zn–O thin film transistors under illumination | ||
| Journal | Applied Physics Letters | ||
| Authors | Kim, Hyun-Suk | Author | |
| Park, Kyung-Bae | Author | ||
| Son, Kyoung Seok | Author | ||
| Park, Joon Seok | Author | ||
| Maeng, Wan-Joo | Author | ||
| Kim, Tae Sang | Author | ||
| Lee, Kwang-Hee | Author | ||
| Kim, Eok Su | Author | ||
| Lee, Jiyoul | Author | ||
| Suh, Joonki | Author | ||
| Seon, Jong-Baek | Author | ||
| Ryu, Myung Kwan | Author | ||
| Lee, Sang Yoon | Author | ||
| Lee, Kimoon | Author | ||
| Im, Seongil | Author | ||
| Year | 2010 (September 6) | Volume | 97 |
| Issue | 10 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.3488823Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8586411 | Long-form Identifier | mindat:1:5:8586411:7 |
| GUID | 0 | ||
| Full Reference | Kim, Hyun-Suk, Park, Kyung-Bae, Son, Kyoung Seok, Park, Joon Seok, Maeng, Wan-Joo, Kim, Tae Sang, Lee, Kwang-Hee, Kim, Eok Su, Lee, Jiyoul, Suh, Joonki, Seon, Jong-Baek, Ryu, Myung Kwan, Lee, Sang Yoon, Lee, Kimoon, Im, Seongil (2010) The influence of sputtering power and O2/Ar flow ratio on the performance and stability of Hf–In–Zn–O thin film transistors under illumination. Applied Physics Letters, 97 (10). 102103pp. doi:10.1063/1.3488823 | ||
| Plain Text | Kim, Hyun-Suk, Park, Kyung-Bae, Son, Kyoung Seok, Park, Joon Seok, Maeng, Wan-Joo, Kim, Tae Sang, Lee, Kwang-Hee, Kim, Eok Su, Lee, Jiyoul, Suh, Joonki, Seon, Jong-Baek, Ryu, Myung Kwan, Lee, Sang Yoon, Lee, Kimoon, Im, Seongil (2010) The influence of sputtering power and O2/Ar flow ratio on the performance and stability of Hf–In–Zn–O thin film transistors under illumination. Applied Physics Letters, 97 (10). 102103pp. doi:10.1063/1.3488823 | ||
| In | (2010, September) Applied Physics Letters Vol. 97 (10) AIP Publishing | ||
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