Kwon, Jang-Yeon, Jung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Park, Jin-Seong, Choi, Rino, Jeong, Jae Kyeong, Koo, Bonwon, Lee, Sang Yoon (2010) The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor. Applied Physics Letters, 97 (18). 183503pp. doi:10.1063/1.3513400
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor | ||
Journal | Applied Physics Letters | ||
Authors | Kwon, Jang-Yeon | Author | |
Jung, Ji Sim | Author | ||
Son, Kyoung Seok | Author | ||
Lee, Kwang-Hee | Author | ||
Park, Joon Seok | Author | ||
Kim, Tae Sang | Author | ||
Park, Jin-Seong | Author | ||
Choi, Rino | Author | ||
Jeong, Jae Kyeong | Author | ||
Koo, Bonwon | Author | ||
Lee, Sang Yoon | Author | ||
Year | 2010 (November) | Volume | 97 |
Issue | 18 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.3513400Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8587839 | Long-form Identifier | mindat:1:5:8587839:6 |
GUID | 0 | ||
Full Reference | Kwon, Jang-Yeon, Jung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Park, Jin-Seong, Choi, Rino, Jeong, Jae Kyeong, Koo, Bonwon, Lee, Sang Yoon (2010) The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor. Applied Physics Letters, 97 (18). 183503pp. doi:10.1063/1.3513400 | ||
Plain Text | Kwon, Jang-Yeon, Jung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Park, Jin-Seong, Choi, Rino, Jeong, Jae Kyeong, Koo, Bonwon, Lee, Sang Yoon (2010) The impact of gate dielectric materials on the light-induced bias instability in Hf–In–Zn–O thin film transistor. Applied Physics Letters, 97 (18). 183503pp. doi:10.1063/1.3513400 | ||
In | (2010, November) Applied Physics Letters Vol. 97 (18) AIP Publishing |
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