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Jung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Kwon, Jang-Yeon, Chung, Kwun-Bum, Park, Jin-Seong, Koo, Bonwon, Lee, Sangyun (2010) The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress. Applied Physics Letters, 96 (19). 193506pp. doi:10.1063/1.3429588

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Reference TypeJournal (article/letter/editorial)
TitleThe impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress
JournalApplied Physics Letters
AuthorsJung, Ji SimAuthor
Son, Kyoung SeokAuthor
Lee, Kwang-HeeAuthor
Park, Joon SeokAuthor
Kim, Tae SangAuthor
Kwon, Jang-YeonAuthor
Chung, Kwun-BumAuthor
Park, Jin-SeongAuthor
Koo, BonwonAuthor
Lee, SangyunAuthor
Year2010 (May 10)Volume96
Issue19
PublisherAIP Publishing
DOIdoi:10.1063/1.3429588Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8583418Long-form Identifiermindat:1:5:8583418:9
GUID0
Full ReferenceJung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Kwon, Jang-Yeon, Chung, Kwun-Bum, Park, Jin-Seong, Koo, Bonwon, Lee, Sangyun (2010) The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress. Applied Physics Letters, 96 (19). 193506pp. doi:10.1063/1.3429588
Plain TextJung, Ji Sim, Son, Kyoung Seok, Lee, Kwang-Hee, Park, Joon Seok, Kim, Tae Sang, Kwon, Jang-Yeon, Chung, Kwun-Bum, Park, Jin-Seong, Koo, Bonwon, Lee, Sangyun (2010) The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress. Applied Physics Letters, 96 (19). 193506pp. doi:10.1063/1.3429588
In(2010, May) Applied Physics Letters Vol. 96 (19) AIP Publishing

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