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Park, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Lee, Eunha, Jung, Ji Sim, Lee, Kwang-Hee, Maeng, Wan-Joo, Kim, Hyun-Suk, Kim, Eok Su, Park, Kyung-Bae, Kwon, Jang-Yeon, Ryu, Myung Kwan, Lee, Sang Yoon (2010) Ti/Cu bilayer electrodes for SiNx-passivated Hf–In–Zn–O thin film transistors: Device performance and contact resistance. Applied Physics Letters, 97 (16). 162105pp. doi:10.1063/1.3505151

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Reference TypeJournal (article/letter/editorial)
TitleTi/Cu bilayer electrodes for SiNx-passivated Hf–In–Zn–O thin film transistors: Device performance and contact resistance
JournalApplied Physics Letters
AuthorsPark, Joon SeokAuthor
Kim, Tae SangAuthor
Son, Kyoung SeokAuthor
Lee, EunhaAuthor
Jung, Ji SimAuthor
Lee, Kwang-HeeAuthor
Maeng, Wan-JooAuthor
Kim, Hyun-SukAuthor
Kim, Eok SuAuthor
Park, Kyung-BaeAuthor
Kwon, Jang-YeonAuthor
Ryu, Myung KwanAuthor
Lee, Sang YoonAuthor
Year2010 (October 18)Volume97
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.3505151Search in ResearchGate
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Mindat Ref. ID8587499Long-form Identifiermindat:1:5:8587499:2
GUID0
Full ReferencePark, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Lee, Eunha, Jung, Ji Sim, Lee, Kwang-Hee, Maeng, Wan-Joo, Kim, Hyun-Suk, Kim, Eok Su, Park, Kyung-Bae, Kwon, Jang-Yeon, Ryu, Myung Kwan, Lee, Sang Yoon (2010) Ti/Cu bilayer electrodes for SiNx-passivated Hf–In–Zn–O thin film transistors: Device performance and contact resistance. Applied Physics Letters, 97 (16). 162105pp. doi:10.1063/1.3505151
Plain TextPark, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Lee, Eunha, Jung, Ji Sim, Lee, Kwang-Hee, Maeng, Wan-Joo, Kim, Hyun-Suk, Kim, Eok Su, Park, Kyung-Bae, Kwon, Jang-Yeon, Ryu, Myung Kwan, Lee, Sang Yoon (2010) Ti/Cu bilayer electrodes for SiNx-passivated Hf–In–Zn–O thin film transistors: Device performance and contact resistance. Applied Physics Letters, 97 (16). 162105pp. doi:10.1063/1.3505151
In(2010, October) Applied Physics Letters Vol. 97 (16) AIP Publishing

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Park, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Lee, Kwang-Hee, Maeng, Wan-Joo, Kim, Hyun-Suk, Kim, Eok Su, Park, Kyung-Bae, Seon, Jong-Baek, Choi, Woong, Ryu, Myung Kwan, Lee, Sang Yoon (2010) The influence of SiOx and SiNx passivation on the negative bias stability of Hf–In–Zn–O thin film transistors under illumination. Applied Physics Letters, 96 (26). 262109pp. doi:10.1063/1.3435482
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