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Pang, C.L, Raza, H, Haycock, S.A, Thornton, G (2000) Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy. Applied Surface Science, 157. 233-238 doi:10.1016/s0169-4332(99)00532-2

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Reference TypeJournal (article/letter/editorial)
TitleImaging reconstructed TiO2 surfaces with non-contact atomic force microscopy
JournalApplied Surface Science
AuthorsPang, C.LAuthor
Raza, HAuthor
Haycock, S.AAuthor
Thornton, GAuthor
Year2000 (April)Volume157
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00532-2Search in ResearchGate
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Mindat Ref. ID9901797Long-form Identifiermindat:1:5:9901797:4
GUID0
Full ReferencePang, C.L, Raza, H, Haycock, S.A, Thornton, G (2000) Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy. Applied Surface Science, 157. 233-238 doi:10.1016/s0169-4332(99)00532-2
Plain TextPang, C.L, Raza, H, Haycock, S.A, Thornton, G (2000) Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy. Applied Surface Science, 157. 233-238 doi:10.1016/s0169-4332(99)00532-2
In(n.d.) Applied Surface Science Vol. 157. Elsevier BV

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Raza, H, Pang, C.L, Haycock, S.A, Thornton, G (1999) Non-contact atomic force microscopy imaging of TiO2(100) surfaces. Applied Surface Science, 140. 271-275 doi:10.1016/s0169-4332(98)00539-x
Ashworth, T.V., Pang, C.L., Wincott, P.L., Vaughan, D.J., Thornton, G. (2003) Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy. Applied Surface Science, 210. 2-5 doi:10.1016/s0169-4332(02)01469-1
Pang, C.L., Muryn, C.A., Woodhead, A.P., Raza, H., Haycock, S.A., Dhanak, V.R., Thornton, G. (2005) Low-coverage condensation of K on TiO2(110) 1×1. Surface Science, 583 (2). doi:10.1016/j.susc.2005.03.033
Pang, C.L., Raza, H., Haycock, S.A., Thornton, G. (2000) Growth of copper and palladium on α-Al2O3(0001). Surface Science, 460 (1). doi:10.1016/s0039-6028(00)00594-x
Ke, S.H, Uda, T, Terakura, K (2000) Frequency shift and energy dissipation in non-contact atomic-force microscopy. Applied Surface Science, 157. 361-366 doi:10.1016/s0169-4332(99)00551-6
Pang, C. L., Raza, H., Haycock, S. A., Thornton, G. (2002) Noncontact atomic force microscopy imaging of ultrathinAl2O3on NiAl(110) Physical Review B, 65 (20) doi:10.1103/physrevb.65.201401
Schmidt, J.U, Bergander, H, Eng, L.M (2000) Experimental and theoretical analysis of shear–force interaction in the non-contact regime with 100 pN force resolution. Applied Surface Science, 157. 295-301 doi:10.1016/s0169-4332(99)00542-5
Hosoi, H, Sueoka, K, Hayakawa, K, Mukasa, K (2000) Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM. Applied Surface Science, 157. 218-221 doi:10.1016/s0169-4332(99)00529-2
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Pfeiffer, O, Loppacher, C, Wattinger, C, Bammerlin, M, Gysin, U, Guggisberg, M, Rast, S, Bennewitz, R, Meyer, E, Güntherodt, H.-J (2000) Using higher flexural modes in non-contact force microscopy. Applied Surface Science, 157. 337-342 doi:10.1016/s0169-4332(99)00548-6
 
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