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Schmidt, J.U, Bergander, H, Eng, L.M (2000) Experimental and theoretical analysis of shear–force interaction in the non-contact regime with 100 pN force resolution. Applied Surface Science, 157. 295-301 doi:10.1016/s0169-4332(99)00542-5

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Reference TypeJournal (article/letter/editorial)
TitleExperimental and theoretical analysis of shear–force interaction in the non-contact regime with 100 pN force resolution
JournalApplied Surface Science
AuthorsSchmidt, J.UAuthor
Bergander, HAuthor
Eng, L.MAuthor
Year2000 (April)Volume157
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00542-5Search in ResearchGate
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Mindat Ref. ID9901807Long-form Identifiermindat:1:5:9901807:0
GUID0
Full ReferenceSchmidt, J.U, Bergander, H, Eng, L.M (2000) Experimental and theoretical analysis of shear–force interaction in the non-contact regime with 100 pN force resolution. Applied Surface Science, 157. 295-301 doi:10.1016/s0169-4332(99)00542-5
Plain TextSchmidt, J.U, Bergander, H, Eng, L.M (2000) Experimental and theoretical analysis of shear–force interaction in the non-contact regime with 100 pN force resolution. Applied Surface Science, 157. 295-301 doi:10.1016/s0169-4332(99)00542-5
In(n.d.) Applied Surface Science Vol. 157. Elsevier BV

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Schmidt, J. U., Bergander, H., Eng, L. M. (2000) Shear force interaction in the viscous damping regime studied at 100 pN force resolution. Journal of Applied Physics, 87 (6). 3108-3112 doi:10.1063/1.372306
Pang, C.L, Raza, H, Haycock, S.A, Thornton, G (2000) Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy. Applied Surface Science, 157. 233-238 doi:10.1016/s0169-4332(99)00532-2
Ke, S.H, Uda, T, Terakura, K (2000) Frequency shift and energy dissipation in non-contact atomic-force microscopy. Applied Surface Science, 157. 361-366 doi:10.1016/s0169-4332(99)00551-6
Luna, M, Colchero, J, Gil, A, Gómez-Herrero, J, Baró, A.M (2000) Application of non-contact scanning force microscopy to the study of water adsorption on graphite, gold and mica. Applied Surface Science, 157. 393-397 doi:10.1016/s0169-4332(99)00556-5
Jarvis, S.P, Yamada, H, Kobayashi, K, Toda, A, Tokumoto, H (2000) Normal and lateral force investigation using magnetically activated force sensors. Applied Surface Science, 157. 314-319 doi:10.1016/s0169-4332(99)00545-0
Eng, L.M, Bammerlin, M, Loppacher, Ch, Guggisberg, M, Bennewitz, R, Lüthi, R, Meyer, E, Güntherodt, H.-J (1999) Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy. Applied Surface Science, 140. 253-258 doi:10.1016/s0169-4332(98)00536-4
Luna, M, Colchero, J, Gómez-Herrero, J, Baró, A.M (2000) Study of tip–sample interaction in scanning force microscopy. Applied Surface Science, 157. 285-289 doi:10.1016/s0169-4332(99)00540-1
Pfeiffer, O, Loppacher, C, Wattinger, C, Bammerlin, M, Gysin, U, Guggisberg, M, Rast, S, Bennewitz, R, Meyer, E, Güntherodt, H.-J (2000) Using higher flexural modes in non-contact force microscopy. Applied Surface Science, 157. 337-342 doi:10.1016/s0169-4332(99)00548-6
Jeffery, Steve, Oral, Ahmet, Pethica, John B (2000) Quantitative electrostatic force measurement in AFM. Applied Surface Science, 157. 280-284 doi:10.1016/s0169-4332(99)00565-6
Okabe, Yoh, Akiba, Uichi, Fujihira, Masamichi (2000) Chemical force microscopy of CH3 and COOH terminal groups in mixed self-assembled monolayers by pulsed-force-mode atomic force microscopy. Applied Surface Science, 157. 398-404 doi:10.1016/s0169-4332(99)00557-7
Raza, H, Pang, C.L, Haycock, S.A, Thornton, G (1999) Non-contact atomic force microscopy imaging of TiO2(100) surfaces. Applied Surface Science, 140. 271-275 doi:10.1016/s0169-4332(98)00539-x
 
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