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Jarvis, S.P, Yamada, H, Kobayashi, K, Toda, A, Tokumoto, H (2000) Normal and lateral force investigation using magnetically activated force sensors. Applied Surface Science, 157. 314-319 doi:10.1016/s0169-4332(99)00545-0

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Reference TypeJournal (article/letter/editorial)
TitleNormal and lateral force investigation using magnetically activated force sensors
JournalApplied Surface Science
AuthorsJarvis, S.PAuthor
Yamada, HAuthor
Kobayashi, KAuthor
Toda, AAuthor
Tokumoto, HAuthor
Year2000 (April)Volume157
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(99)00545-0Search in ResearchGate
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Mindat Ref. ID9901810Long-form Identifiermindat:1:5:9901810:4
GUID0
Full ReferenceJarvis, S.P, Yamada, H, Kobayashi, K, Toda, A, Tokumoto, H (2000) Normal and lateral force investigation using magnetically activated force sensors. Applied Surface Science, 157. 314-319 doi:10.1016/s0169-4332(99)00545-0
Plain TextJarvis, S.P, Yamada, H, Kobayashi, K, Toda, A, Tokumoto, H (2000) Normal and lateral force investigation using magnetically activated force sensors. Applied Surface Science, 157. 314-319 doi:10.1016/s0169-4332(99)00545-0
In(n.d.) Applied Surface Science Vol. 157. Elsevier BV

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Jarvis, S. P., Tokumoto, H., Yamada, H., Kobayashi, K., Toda, A. (1999) Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy. Applied Physics Letters, 75 (24). 3883-3885 doi:10.1063/1.125488
Jarvis, S.P., Lantz, M.A., Dürig, U., Tokumoto, H. (1999) Off resonance ac mode force spectroscopy and imaging with an atomic force microscope. Applied Surface Science, 140. 309-313 doi:10.1016/s0169-4332(98)00546-7
Kimura, K., Kobayashi, K., Yamada, H., Matsushige, K. (2003) Two-dimensional dopant profiling by scanning capacitance force microscopy. Applied Surface Science, 210. 93-98 doi:10.1016/s0169-4332(02)01486-1
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Pang, C.L, Raza, H, Haycock, S.A, Thornton, G (2000) Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy. Applied Surface Science, 157. 233-238 doi:10.1016/s0169-4332(99)00532-2
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Jarvis, S. P., Yamamoto, S.-I., Yamada, H., Tokumoto, H., Pethica, J. B. (1997) Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum. Applied Physics Letters, 70 (17). 2238-2240 doi:10.1063/1.118826
Kobayashi, Kei, Yamada, Hirofumi, Horiuchi, Toshihisa, Matsushige, Kazumi (2000) Imaging of fullerene molecules on Si(111)-7×7 surface with NC-AFM. Applied Surface Science, 157. 228-232 doi:10.1016/s0169-4332(99)00531-0
Nishi, Ryuji, Houda, Isao, Aramata, Tomohide, Sugawara, Yasuhiro, Morita, Seizo (2000) Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy. Applied Surface Science, 157. 332-336 doi:10.1016/s0169-4332(99)00547-4
 
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