Reference Type | Journal (article/letter/editorial) |
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Title | Frequency shift and energy dissipation in non-contact atomic-force microscopy |
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Journal | Applied Surface Science |
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Authors | Ke, S.H | Author |
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Uda, T | Author |
Terakura, K | Author |
Year | 2000 (April) | Volume | 157 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0169-4332(99)00551-6Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 9901816 | Long-form Identifier | mindat:1:5:9901816:8 |
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GUID | 0 |
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Full Reference | Ke, S.H, Uda, T, Terakura, K (2000) Frequency shift and energy dissipation in non-contact atomic-force microscopy. Applied Surface Science, 157. 361-366 doi:10.1016/s0169-4332(99)00551-6 |
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Plain Text | Ke, S.H, Uda, T, Terakura, K (2000) Frequency shift and energy dissipation in non-contact atomic-force microscopy. Applied Surface Science, 157. 361-366 doi:10.1016/s0169-4332(99)00551-6 |
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In | (n.d.) Applied Surface Science Vol. 157. Elsevier BV |
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