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Tellier, C. R. (1984) Angular and surface roughness dependence of the electrical conductivity of thin metal films. Journal of Materials Science Letters, 3 (5) 464-468 doi:10.1007/bf00724393

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Reference TypeJournal (article/letter/editorial)
TitleAngular and surface roughness dependence of the electrical conductivity of thin metal films
JournalJournal of Materials Science Letters
AuthorsTellier, C. R.Author
Year1984 (May)Volume3
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00724393Search in ResearchGate
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Mindat Ref. ID16408916Long-form Identifiermindat:1:5:16408916:7
GUID0
Full ReferenceTellier, C. R. (1984) Angular and surface roughness dependence of the electrical conductivity of thin metal films. Journal of Materials Science Letters, 3 (5) 464-468 doi:10.1007/bf00724393
Plain TextTellier, C. R. (1984) Angular and surface roughness dependence of the electrical conductivity of thin metal films. Journal of Materials Science Letters, 3 (5) 464-468 doi:10.1007/bf00724393
In(1984, May) Journal of Materials Science Letters Vol. 3 (5) Springer Science and Business Media LLC

See Also

These are possibly similar items as determined by title/reference text matching only.

Tellier, C. R. (1987) Surface roughness and transverse magnetic field dependence of the Hall coefficient and the magnetoresistance in thin metal films. Journal of Materials Science, 22. 2906-2912 doi:10.1007/bf01086489
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Tellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865
Tellier, C. R. (1985) Experimental determination of the surface roughness parameter in metal films. Journal of Materials Science, 20. 4514-4520 doi:10.1007/bf00559342
Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1982) Graphical determination of the energy dependence of the thermoelectric power of thin monocrystalline metal films. Journal of Materials Science, 17. 290-294 doi:10.1007/bf00809064
Ouarbya, L., Tosser, A. J., Tellier, C. R. (1981) Effects of electron scatterings on thermal conductivity of thin metal films. Journal of Materials Science, 16. 2287-2289 doi:10.1007/bf00542392
Vatamanyuk, V. I., Tosser, A. J., Pichard, C. R., Tellier, C. R. (1984) Linearized equations for the electronic transport properties of thin metal films. Journal of Materials Science, 19. 4138-4146 doi:10.1007/bf00980782
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) General expression for the Hall coefficient of thin metal films. Journal of Materials Science Letters, 1 (6) 260-263 doi:10.1007/bf00727851
Pichard, C. R., Vatamanyuk, V. I., Khalid-Naciri, A., Tellier, C. R., Tosser, A. J. (1984) The theoretical values for the resistivity, the tcr and the Hall coefficient of thin columnar and polycrystalline films. Journal of Materials Science Letters, 3 (5) 447-450 doi:10.1007/bf00724389
Tellier, C. R. (1985) Effect of defect structure on the electrical conduction mechanism in metallic thin films. Journal of Materials Science, 20. 1901-1919 doi:10.1007/bf01112272
 
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