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Ouarbya, L., Tosser, A. J., Tellier, C. R. (1981) Effects of electron scatterings on thermal conductivity of thin metal films. Journal of Materials Science, 16. 2287-2289 doi:10.1007/bf00542392

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Reference TypeJournal (article/letter/editorial)
TitleEffects of electron scatterings on thermal conductivity of thin metal films
JournalJournal of Materials Science
AuthorsOuarbya, L.Author
Tosser, A. J.Author
Tellier, C. R.Author
Year1981 (August)Volume16
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf00542392Search in ResearchGate
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Mindat Ref. ID9985170Long-form Identifiermindat:1:5:9985170:3
GUID0
Full ReferenceOuarbya, L., Tosser, A. J., Tellier, C. R. (1981) Effects of electron scatterings on thermal conductivity of thin metal films. Journal of Materials Science, 16. 2287-2289 doi:10.1007/bf00542392
Plain TextOuarbya, L., Tosser, A. J., Tellier, C. R. (1981) Effects of electron scatterings on thermal conductivity of thin metal films. Journal of Materials Science, 16. 2287-2289 doi:10.1007/bf00542392
In(n.d.) Journal of Materials Science Vol. 16. Springer Science and Business Media LLC

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Pichard, C. R., Tosser, A. J., Deschacht, D., Boyer, A., Groubert, E., Tellier, C. R. (1981) Cumulative size effects in electrical conductivity of thin semi-metal films. Journal of Materials Science, 16. 2798-2802 doi:10.1007/bf02402844
Tellier, C. R., Tosser, A. J., Pichard, C. R. (1981) About the origin of magnetoresistance in relatively thin metal films. Journal of Materials Science, 16. 1118-1121 doi:10.1007/bf00542763
Tellier, C. R., Pichard, C. R., Tosser, A. J. (1981) Three-dimensional strain coefficients of resistivity of thin polycrystalline metal films. Journal of Materials Science, 16. 2281-2286 doi:10.1007/bf00542391
Pichard, C. R., Tellier, C. R., Ouarbya, L., Tosser, A. J. (1981) Perturbations in transport properties of thin metal films due to energy-dependent relaxation time. physica status solidi (a), 68 (2). 477-482 doi:10.1002/pssa.2210680217
Guendouz, L., Tellier, C. R., Tosser, A. J., Pichard, C. R. (1984) Simple equations for the conductivity of thin metal films with unlike surfaces. Journal of Materials Science Letters, 3 (5) 377-380 doi:10.1007/bf00724371
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1981) Theoretical analysis of the Hall effect in thin polycrystalline metallic films. Journal of Materials Science, 16. 451-456 doi:10.1007/bf00738636
Tosser, A. J., Tellier, C. R., Pichard, C. R. (1981) Thin polycrystalline metallic-film conductivity under the assumption of isotropic grain-boundary scattering. Journal of Materials Science, 16. 944-948 doi:10.1007/bf00542738
Pichard, C. R., Tosser, A. J., Tellier, C. R. (1982) Thermoelectric power of supported thin polycrystalline films. Journal of Materials Science, 17. 10-16 doi:10.1007/bf00809029
Pichard, C. R., Tosser, A. J., Tellier, C. R., Barua, K. C. (1981) Theoretical analysis of the transverse Hall effect in thin monocrystalline films. Journal of Materials Science, 16. 2480-2484 doi:10.1007/bf01113584
Tellier, C. R., Pichard, C. R., Vatamanyuk, V. I., Tosser, A. J. (1983) Electrical conductivity of thin metal films grown in a columnar fashion. Journal of Materials Science Letters, 2 (10) 579-582 doi:10.1007/bf00719865
Pichard, C. R., Tellier, C. R., Tosser, A. J. (1980) Linear variations in conductivity with thickness of thin polycrystalline films. Journal of Materials Science, 15. 2236-2240 doi:10.1007/bf00552312
 
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